The UltraSPARC T1 Processor: CMT Reliability

Throughput computing represents a new paradigm in processor design focusing on maximizing overall throughput of commercial workloads while addressing increasing demands for improved power, cooling and reliability in today's datacenters. The first generation of "Niagara" SPARC processo...

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Bibliographische Detailangaben
Hauptverfasser:	Leon, A.S., Langley, B., Jinuk Luke Shin
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	alpha particles Availability Bandwidth Channel Hot Carrier (CHC) Chip MultiThreading (CMT) chip reliability CMOS technology Computer architecture Cooling Design optimization Electromigration (EM) Error Correcting Code (ECC) Gate-Oxide Integrity (GOI) low power multicore Multithreading Negative Bias Temperature Instability (NBTI) Niagara processor parity protection Power generation power management Process design Random access memory Reliability reliability-aware Serviceability (RAS) Soft Error Rate (SER) redundancy thermal management Throughput throughput performance UltraSPARC T1
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