A Zinc Oxide modified Porous Silicon humidity sensor

In this paper, a relative humidity sensor based on zinc oxide modified porous silicon was discussed. The porous silicon was prepared by electrochemical etching process first. Then the sol-gel precursor of Zinc Oxide was applied to the PS substrates and annealed at 450 degC. By this technique, it is...

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Hauptverfasser: Tao Jiang, Xiaofeng Zhou, Jian Zhang, Yanling Shi, Tianxing Luo
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Xiaofeng Zhou
Jian Zhang
Yanling Shi
Tianxing Luo
description In this paper, a relative humidity sensor based on zinc oxide modified porous silicon was discussed. The porous silicon was prepared by electrochemical etching process first. Then the sol-gel precursor of Zinc Oxide was applied to the PS substrates and annealed at 450 degC. By this technique, it is possible to obtain a uniform zinc oxide film on the porous silicon substrates. The electrical conductivities of the porous silicon and zinc oxide/porous silicon structures under different humidity levels were measured. It is indicated that the modification of the porous silicon by sol-gel zinc oxide increase the sensitivity and shorten the response time to the relative humidity
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4097842</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4097842</ieee_id><sourcerecordid>4097842</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-4b0434a1f312af3f93b149b0fffb7cfc8a0a101005c41e7d1187144b7500927a3</originalsourceid><addsrcrecordid>eNo1j8FKxDAURSMiqGP3gpv8QOt7ycukWZaiTmFgBHXjZkjbBJ9MW2lmwPl7B9S7OZzNgSvELUKBCO6-qZuqUADLQoNx4M7ENZIiAqOcPReZs-W_l-pSZCl9wmnaGVTLK0GVfOexk5tv7oMcpp4jh14-T_N0SPKFd9xNo_w4DNzz_ihTGNM034iL6HcpZH9ciLfHh9d6la83T01drXNGa_Y5tUCaPEaNykcdnW6RXAsxxtZ2sSs9eAQEMB1hsD1iaZGotQbAKev1Qtz9djmEsP2aefDzcUtw-kRK_wANBUSw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A Zinc Oxide modified Porous Silicon humidity sensor</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Tao Jiang ; Xiaofeng Zhou ; Jian Zhang ; Yanling Shi ; Tianxing Luo</creator><creatorcontrib>Tao Jiang ; Xiaofeng Zhou ; Jian Zhang ; Yanling Shi ; Tianxing Luo</creatorcontrib><description>In this paper, a relative humidity sensor based on zinc oxide modified porous silicon was discussed. The porous silicon was prepared by electrochemical etching process first. Then the sol-gel precursor of Zinc Oxide was applied to the PS substrates and annealed at 450 degC. By this technique, it is possible to obtain a uniform zinc oxide film on the porous silicon substrates. The electrical conductivities of the porous silicon and zinc oxide/porous silicon structures under different humidity levels were measured. It is indicated that the modification of the porous silicon by sol-gel zinc oxide increase the sensitivity and shorten the response time to the relative humidity</description><identifier>ISBN: 9781424405282</identifier><identifier>ISBN: 1424405289</identifier><identifier>EISBN: 1424405297</identifier><identifier>EISBN: 9781424405299</identifier><identifier>DOI: 10.1109/ICIA.2006.305909</identifier><language>eng</language><publisher>IEEE</publisher><subject>Annealing ; Conductivity measurement ; Delay ; Electric variables measurement ; Etching ; Humidity measurement ; humidity sensor ; modified Porous Silicon ; Semiconductor films ; Silicon ; sol-gel ; Substrates ; Zinc oxide</subject><ispartof>2006 IEEE International Conference on Information Acquisition, 2006, p.1158-1162</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4097842$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,781,785,790,791,2059,27930,54925</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4097842$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Tao Jiang</creatorcontrib><creatorcontrib>Xiaofeng Zhou</creatorcontrib><creatorcontrib>Jian Zhang</creatorcontrib><creatorcontrib>Yanling Shi</creatorcontrib><creatorcontrib>Tianxing Luo</creatorcontrib><title>A Zinc Oxide modified Porous Silicon humidity sensor</title><title>2006 IEEE International Conference on Information Acquisition</title><addtitle>ICIA</addtitle><description>In this paper, a relative humidity sensor based on zinc oxide modified porous silicon was discussed. The porous silicon was prepared by electrochemical etching process first. Then the sol-gel precursor of Zinc Oxide was applied to the PS substrates and annealed at 450 degC. By this technique, it is possible to obtain a uniform zinc oxide film on the porous silicon substrates. The electrical conductivities of the porous silicon and zinc oxide/porous silicon structures under different humidity levels were measured. It is indicated that the modification of the porous silicon by sol-gel zinc oxide increase the sensitivity and shorten the response time to the relative humidity</description><subject>Annealing</subject><subject>Conductivity measurement</subject><subject>Delay</subject><subject>Electric variables measurement</subject><subject>Etching</subject><subject>Humidity measurement</subject><subject>humidity sensor</subject><subject>modified Porous Silicon</subject><subject>Semiconductor films</subject><subject>Silicon</subject><subject>sol-gel</subject><subject>Substrates</subject><subject>Zinc oxide</subject><isbn>9781424405282</isbn><isbn>1424405289</isbn><isbn>1424405297</isbn><isbn>9781424405299</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1j8FKxDAURSMiqGP3gpv8QOt7ycukWZaiTmFgBHXjZkjbBJ9MW2lmwPl7B9S7OZzNgSvELUKBCO6-qZuqUADLQoNx4M7ENZIiAqOcPReZs-W_l-pSZCl9wmnaGVTLK0GVfOexk5tv7oMcpp4jh14-T_N0SPKFd9xNo_w4DNzz_ihTGNM034iL6HcpZH9ciLfHh9d6la83T01drXNGa_Y5tUCaPEaNykcdnW6RXAsxxtZ2sSs9eAQEMB1hsD1iaZGotQbAKev1Qtz9djmEsP2aefDzcUtw-kRK_wANBUSw</recordid><startdate>200608</startdate><enddate>200608</enddate><creator>Tao Jiang</creator><creator>Xiaofeng Zhou</creator><creator>Jian Zhang</creator><creator>Yanling Shi</creator><creator>Tianxing Luo</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200608</creationdate><title>A Zinc Oxide modified Porous Silicon humidity sensor</title><author>Tao Jiang ; Xiaofeng Zhou ; Jian Zhang ; Yanling Shi ; Tianxing Luo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-4b0434a1f312af3f93b149b0fffb7cfc8a0a101005c41e7d1187144b7500927a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Annealing</topic><topic>Conductivity measurement</topic><topic>Delay</topic><topic>Electric variables measurement</topic><topic>Etching</topic><topic>Humidity measurement</topic><topic>humidity sensor</topic><topic>modified Porous Silicon</topic><topic>Semiconductor films</topic><topic>Silicon</topic><topic>sol-gel</topic><topic>Substrates</topic><topic>Zinc oxide</topic><toplevel>online_resources</toplevel><creatorcontrib>Tao Jiang</creatorcontrib><creatorcontrib>Xiaofeng Zhou</creatorcontrib><creatorcontrib>Jian Zhang</creatorcontrib><creatorcontrib>Yanling Shi</creatorcontrib><creatorcontrib>Tianxing Luo</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tao Jiang</au><au>Xiaofeng Zhou</au><au>Jian Zhang</au><au>Yanling Shi</au><au>Tianxing Luo</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A Zinc Oxide modified Porous Silicon humidity sensor</atitle><btitle>2006 IEEE International Conference on Information Acquisition</btitle><stitle>ICIA</stitle><date>2006-08</date><risdate>2006</risdate><spage>1158</spage><epage>1162</epage><pages>1158-1162</pages><isbn>9781424405282</isbn><isbn>1424405289</isbn><eisbn>1424405297</eisbn><eisbn>9781424405299</eisbn><abstract>In this paper, a relative humidity sensor based on zinc oxide modified porous silicon was discussed. The porous silicon was prepared by electrochemical etching process first. Then the sol-gel precursor of Zinc Oxide was applied to the PS substrates and annealed at 450 degC. By this technique, it is possible to obtain a uniform zinc oxide film on the porous silicon substrates. The electrical conductivities of the porous silicon and zinc oxide/porous silicon structures under different humidity levels were measured. It is indicated that the modification of the porous silicon by sol-gel zinc oxide increase the sensitivity and shorten the response time to the relative humidity</abstract><pub>IEEE</pub><doi>10.1109/ICIA.2006.305909</doi><tpages>5</tpages></addata></record>
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Annealing
Conductivity measurement
Delay
Electric variables measurement
Etching
Humidity measurement
humidity sensor
modified Porous Silicon
Semiconductor films
Silicon
sol-gel
Substrates
Zinc oxide
title A Zinc Oxide modified Porous Silicon humidity sensor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-14T11%3A58%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20Zinc%20Oxide%20modified%20Porous%20Silicon%20humidity%20sensor&rft.btitle=2006%20IEEE%20International%20Conference%20on%20Information%20Acquisition&rft.au=Tao%20Jiang&rft.date=2006-08&rft.spage=1158&rft.epage=1162&rft.pages=1158-1162&rft.isbn=9781424405282&rft.isbn_list=1424405289&rft_id=info:doi/10.1109/ICIA.2006.305909&rft_dat=%3Cieee_6IE%3E4097842%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424405297&rft.eisbn_list=9781424405299&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4097842&rfr_iscdi=true