IC variability minimization using a new C/sub p/ and C/sub pk/ based variability/performance measure

A new performance measure, based on the capability indices C/sub p/ and C/sub pk/ (commonly used in process control), is proposed for general circuit Design for Quality. It overcomes some of the critical limitations of the traditional quadratic loss function (e.g., that of Taguchi) and leads to the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Aftab, S.A., Styblinski, M.A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automation Circuit optimization Circuit synthesis Concrete Design for quality Electric variables measurement Integrated circuit yield Manufacturing Minimization methods Process control
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