Moisture measurement in walls using microwaves
A novel measurement procedure and set-up is presented, which is suitable for moisture measurements in brick- and stone walls at places, where the wall is accessible only from one side. Local dielectric constant and hence spatial moisture content profile are determined by tracing the complex electric...
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| creator | Menke, F. Knochel, R. Boltze, T. Hauenschild, C. Leschnik, W. |
| description | A novel measurement procedure and set-up is presented, which is suitable for moisture measurements in brick- and stone walls at places, where the wall is accessible only from one side. Local dielectric constant and hence spatial moisture content profile are determined by tracing the complex electric field using an electrically small field probe, which intrudes and is moved in a small bore-hole. Only one hole with a diameter of 8-15 mm is needed. A prototype setup and measurements are presented in order to demonstrate the practicability of the method.< > |
| doi_str_mv | 10.1109/MWSYM.1995.406175 |
| format | Conference Proceeding |
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Local dielectric constant and hence spatial moisture content profile are determined by tracing the complex electric field using an electrically small field probe, which intrudes and is moved in a small bore-hole. Only one hole with a diameter of 8-15 mm is needed. 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Local dielectric constant and hence spatial moisture content profile are determined by tracing the complex electric field using an electrically small field probe, which intrudes and is moved in a small bore-hole. Only one hole with a diameter of 8-15 mm is needed. A prototype setup and measurements are presented in order to demonstrate the practicability of the method.< ></description><subject>Antenna measurements</subject><subject>Dielectric constant</subject><subject>Dielectric measurements</subject><subject>Drilling</subject><subject>Electrodes</subject><subject>Microwave measurements</subject><subject>Moisture measurement</subject><subject>Monitoring</subject><subject>Rough surfaces</subject><subject>Surface roughness</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>9780780325814</isbn><isbn>0780325818</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1995</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj81Kw0AURgd_wFDzALrKCyTO353JXUpRKzS4aEVdlZnkRkaSVDKpxbc3UA8fnN0Hh7EbwQshON5Vb5uPqhCIUGhuhIUzlkiwJrdSmHOWoi35PCWhFPqCJVxozI2G9yuWxvjFZzSAgjJhRbUPcTqMlPXk4uyehikLQ3Z0XRezQwzDZ9aHetwf3Q_Fa3bZui5S-u8Fe3182C5X-frl6Xl5v85rKfmUo1VALW-NI2o8h5oaW7bGa6Mai9Z4aT3WSlItjQMkT9pbLkuJrUJuSC3Y7ek3ENHuewy9G393p1j1By1BRoM</recordid><startdate>1995</startdate><enddate>1995</enddate><creator>Menke, F.</creator><creator>Knochel, R.</creator><creator>Boltze, T.</creator><creator>Hauenschild, C.</creator><creator>Leschnik, W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1995</creationdate><title>Moisture measurement in walls using microwaves</title><author>Menke, F. ; Knochel, R. ; Boltze, T. ; Hauenschild, C. ; Leschnik, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c220t-9735ef0f6aeedb05ced78f6b463d7976b27b9c32ec26a59ebe4b702829f3906e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Antenna measurements</topic><topic>Dielectric constant</topic><topic>Dielectric measurements</topic><topic>Drilling</topic><topic>Electrodes</topic><topic>Microwave measurements</topic><topic>Moisture measurement</topic><topic>Monitoring</topic><topic>Rough surfaces</topic><topic>Surface roughness</topic><toplevel>online_resources</toplevel><creatorcontrib>Menke, F.</creatorcontrib><creatorcontrib>Knochel, R.</creatorcontrib><creatorcontrib>Boltze, T.</creatorcontrib><creatorcontrib>Hauenschild, C.</creatorcontrib><creatorcontrib>Leschnik, W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Menke, F.</au><au>Knochel, R.</au><au>Boltze, T.</au><au>Hauenschild, C.</au><au>Leschnik, W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Moisture measurement in walls using microwaves</atitle><btitle>Proceedings of 1995 IEEE MTT-S International Microwave Symposium</btitle><stitle>MWSYM</stitle><date>1995</date><risdate>1995</risdate><spage>1147</spage><epage>1150 vol.3</epage><pages>1147-1150 vol.3</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>9780780325814</isbn><isbn>0780325818</isbn><abstract>A novel measurement procedure and set-up is presented, which is suitable for moisture measurements in brick- and stone walls at places, where the wall is accessible only from one side. Local dielectric constant and hence spatial moisture content profile are determined by tracing the complex electric field using an electrically small field probe, which intrudes and is moved in a small bore-hole. Only one hole with a diameter of 8-15 mm is needed. A prototype setup and measurements are presented in order to demonstrate the practicability of the method.< ></abstract><pub>IEEE</pub><doi>10.1109/MWSYM.1995.406175</doi></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0149-645X |
| ispartof | Proceedings of 1995 IEEE MTT-S International Microwave Symposium, 1995, p.1147-1150 vol.3 |
| issn | 0149-645X 2576-7216 |
| language | eng |
| recordid | cdi_ieee_primary_406175 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Antenna measurements Dielectric constant Dielectric measurements Drilling Electrodes Microwave measurements Moisture measurement Monitoring Rough surfaces Surface roughness |
| title | Moisture measurement in walls using microwaves |
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