The Relationship of CdS/CdTe Cell Band Profiles to J-V Characteristics and Bias-Dependent Quantum Efficiency
The built-in voltage (V bi ) and the charged electronic state (ES) distribution in a solar cell determine its conduction and valence band profiles. Changes in the charge state of the ES give rise to J-V curve anomalies like cross-over, roll-over, and, in some cases, long J-V and capacitance transien...
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description | The built-in voltage (V bi ) and the charged electronic state (ES) distribution in a solar cell determine its conduction and valence band profiles. Changes in the charge state of the ES give rise to J-V curve anomalies like cross-over, roll-over, and, in some cases, long J-V and capacitance transient effects. CdTe is highly compensated containing deep donor- and acceptor-like ES, with larger densities than the shallow acceptor density. For close compensation, the charge density in the depletion layer can be so low that V bi is determined by the front and back contact work functions. In that case the cells must be analyzed in terms of an n/i/p junction model. AMPS models of two extreme profiles are discussed here as illustrations: an n/i/p junction, where V bi is mainly supported by charge at the contacts, and an n/p junction, where V bi is supported by charge in the bulk CdTe within the absorber |
doi_str_mv | 10.1109/WCPEC.2006.279468 |
format | Conference Proceeding |
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Changes in the charge state of the ES give rise to J-V curve anomalies like cross-over, roll-over, and, in some cases, long J-V and capacitance transient effects. CdTe is highly compensated containing deep donor- and acceptor-like ES, with larger densities than the shallow acceptor density. For close compensation, the charge density in the depletion layer can be so low that V bi is determined by the front and back contact work functions. In that case the cells must be analyzed in terms of an n/i/p junction model. AMPS models of two extreme profiles are discussed here as illustrations: an n/i/p junction, where V bi is mainly supported by charge at the contacts, and an n/p junction, where V bi is supported by charge in the bulk CdTe within the absorber</description><identifier>ISSN: 0160-8371</identifier><identifier>ISBN: 1424400163</identifier><identifier>ISBN: 9781424400164</identifier><identifier>EISBN: 1424400171</identifier><identifier>EISBN: 9781424400171</identifier><identifier>DOI: 10.1109/WCPEC.2006.279468</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Charge carrier lifetime ; Doping ; Impurities ; Neodymium ; Optical films ; Photovoltaic cells ; Radiative recombination ; Shape control ; Voltage</subject><ispartof>2006 IEEE 4th World Conference on Photovoltaic Energy Conference, 2006, Vol.1, p.376-379</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4059641$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2052,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4059641$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Fahrenbruch, A.L.</creatorcontrib><title>The Relationship of CdS/CdTe Cell Band Profiles to J-V Characteristics and Bias-Dependent Quantum Efficiency</title><title>2006 IEEE 4th World Conference on Photovoltaic Energy Conference</title><addtitle>WCPEC</addtitle><description>The built-in voltage (V bi ) and the charged electronic state (ES) distribution in a solar cell determine its conduction and valence band profiles. Changes in the charge state of the ES give rise to J-V curve anomalies like cross-over, roll-over, and, in some cases, long J-V and capacitance transient effects. CdTe is highly compensated containing deep donor- and acceptor-like ES, with larger densities than the shallow acceptor density. For close compensation, the charge density in the depletion layer can be so low that V bi is determined by the front and back contact work functions. In that case the cells must be analyzed in terms of an n/i/p junction model. AMPS models of two extreme profiles are discussed here as illustrations: an n/i/p junction, where V bi is mainly supported by charge at the contacts, and an n/p junction, where V bi is supported by charge in the bulk CdTe within the absorber</description><subject>Capacitance</subject><subject>Charge carrier lifetime</subject><subject>Doping</subject><subject>Impurities</subject><subject>Neodymium</subject><subject>Optical films</subject><subject>Photovoltaic cells</subject><subject>Radiative recombination</subject><subject>Shape control</subject><subject>Voltage</subject><issn>0160-8371</issn><isbn>1424400163</isbn><isbn>9781424400164</isbn><isbn>1424400171</isbn><isbn>9781424400171</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFjN1KwzAYQCMq6KYPIN7kBbrla7KkvXRx_jFw6tTL8TX5yiJdO5rsYm_vRMGrw4HDYewKxAhAlONPu5jZUS6EHuWmVLo4YgNQuVJCgIHjf9HyhJ0fILJCGjhjgxi_hMiF1HDOmuWa-Cs1mELXxnXY8q7m1r-NrV8St9Q0fIqt54u-q0NDkaeOP2Uf3K6xR5eoDzEFF_lPMw0Ys1vaUuupTfxlh23abfisroML1Lr9BTutsYl0-cche7-bLe1DNn--f7Q38yyAmaQMvKkIqSAE6QG1NgpJkSsl6aLCspDgUTsvSB-srlRFxmnEwhsscsrlkF3_fgMRrbZ92GC_XykxKbUC-Q36HlsW</recordid><startdate>200605</startdate><enddate>200605</enddate><creator>Fahrenbruch, A.L.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200605</creationdate><title>The Relationship of CdS/CdTe Cell Band Profiles to J-V Characteristics and Bias-Dependent Quantum Efficiency</title><author>Fahrenbruch, A.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-1d7beae8ea13d1a6674ae4ec93e68ba9831da6cd0e6ba9fb4be7c6aa8d7a82e23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Capacitance</topic><topic>Charge carrier lifetime</topic><topic>Doping</topic><topic>Impurities</topic><topic>Neodymium</topic><topic>Optical films</topic><topic>Photovoltaic cells</topic><topic>Radiative recombination</topic><topic>Shape control</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Fahrenbruch, A.L.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fahrenbruch, A.L.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The Relationship of CdS/CdTe Cell Band Profiles to J-V Characteristics and Bias-Dependent Quantum Efficiency</atitle><btitle>2006 IEEE 4th World Conference on Photovoltaic Energy Conference</btitle><stitle>WCPEC</stitle><date>2006-05</date><risdate>2006</risdate><volume>1</volume><spage>376</spage><epage>379</epage><pages>376-379</pages><issn>0160-8371</issn><isbn>1424400163</isbn><isbn>9781424400164</isbn><eisbn>1424400171</eisbn><eisbn>9781424400171</eisbn><abstract>The built-in voltage (V bi ) and the charged electronic state (ES) distribution in a solar cell determine its conduction and valence band profiles. Changes in the charge state of the ES give rise to J-V curve anomalies like cross-over, roll-over, and, in some cases, long J-V and capacitance transient effects. CdTe is highly compensated containing deep donor- and acceptor-like ES, with larger densities than the shallow acceptor density. For close compensation, the charge density in the depletion layer can be so low that V bi is determined by the front and back contact work functions. In that case the cells must be analyzed in terms of an n/i/p junction model. AMPS models of two extreme profiles are discussed here as illustrations: an n/i/p junction, where V bi is mainly supported by charge at the contacts, and an n/p junction, where V bi is supported by charge in the bulk CdTe within the absorber</abstract><pub>IEEE</pub><doi>10.1109/WCPEC.2006.279468</doi><tpages>4</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Capacitance Charge carrier lifetime Doping Impurities Neodymium Optical films Photovoltaic cells Radiative recombination Shape control Voltage |
title | The Relationship of CdS/CdTe Cell Band Profiles to J-V Characteristics and Bias-Dependent Quantum Efficiency |
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