Mentor Graphics DFT to Navigate Nanometer Test Challenges

Nanometer designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries. Semiconductor companies creating these nanometer designs are struggling with many issues that result from this shrinking complex design environment. Mentor graphics design-for-test is committed to h...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Aldrich, G., Press, R., Kobayashi, T.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic test pattern generation Costs Design for testability Fault detection Geometry Graphics Navigation Semiconductor device testing System testing Time to market
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!