High current densities and associated failure mechanisms in long narrow Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ lines

The use of high temperature superconducting thin films in chip-to-chip interconnects requires the fabrication of long, narrow lines capable of carrying high current density on large area films. The capability of Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ thin films and patterning technology were studied...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 1995-06, Vol.5 (2), p.1693-1696
Hauptverfasser:	Holstein, W.L., Wilker, C., Pang, P.S.W., Laubacher, D.B., McKenna, S.P., Face, D.W.
Format:	Artikel
Sprache:	eng
Schlagworte:	Conductivity Critical current density Current density Density measurement Fabrication Failure analysis High temperature superconductors Length measurement Superconducting materials Transistors
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