Response of Correlated Double Sampling CMOS Imager Circuit to Random Telegraph Signal Noise

This paper presents analytical and experimental noise of a correlated double sampling (CDS) readout circuit used in CMOS active pixel image sensors. The work takes into account low frequency noise, mainly random telegraph signal (RTS) noise, in modern MOS transistors with very small geometries. The...

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Hauptverfasser: Leyris, C., Vildeuil, J.C., Roy, F., Martinez, F., Valenza, M., Hoffmann, A.
Format: Tagungsbericht
Sprache:eng
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