An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning
A Frame-Transfer CCD imager for consumer applications has been developed with low dark current by using hole accumulation at the entire Si-SiO/sub 2/ interface of the image pixel during integration, called "All-Gates Pinning", or AGP. All sensor features, such as vertical anti-blooming and...
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Veröffentlicht in: | IEEE transactions on electron devices 1995-08, Vol.42 (8), p.1449-1460 |
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container_title | IEEE transactions on electron devices |
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creator | Bosiers, J.T. Roks, E. Peek, H.L. Kleimann, A.C. Van der Sijde, A.G. |
description | A Frame-Transfer CCD imager for consumer applications has been developed with low dark current by using hole accumulation at the entire Si-SiO/sub 2/ interface of the image pixel during integration, called "All-Gates Pinning", or AGP. All sensor features, such as vertical anti-blooming and electronic shutter are maintained. The sensor combines thin polysilicon electrodes with mosaic color filters for increased sensitivity and resolution, and uses minimized capacitances and a double metal technology for increased frame shift frequency to obtain low smear. The image pixel operation and optimization are presented, Measurements show a 30 times lower dark current, and 8 times lower fixed-pattern noise with all-gates pinning compared to a conventional device. A frame shift frequency of 15 MHz is achieved. These new features allow the reduction from 2/3" to 1/3" image format without sacrificing the performance.< > |
doi_str_mv | 10.1109/16.398659 |
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All sensor features, such as vertical anti-blooming and electronic shutter are maintained. The sensor combines thin polysilicon electrodes with mosaic color filters for increased sensitivity and resolution, and uses minimized capacitances and a double metal technology for increased frame shift frequency to obtain low smear. The image pixel operation and optimization are presented, Measurements show a 30 times lower dark current, and 8 times lower fixed-pattern noise with all-gates pinning compared to a conventional device. A frame shift frequency of 15 MHz is achieved. These new features allow the reduction from 2/3" to 1/3" image format without sacrificing the performance.< ></description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/16.398659</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Capacitive sensors ; Charge coupled devices ; Colored noise ; Dark current ; Electrodes ; Filters ; Frequency ; Pixel ; Sensor phenomena and characterization</subject><ispartof>IEEE transactions on electron devices, 1995-08, Vol.42 (8), p.1449-1460</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c192t-31cdd0a8028a548c280a65f61b1c2506a6ea4305f63e139c8d8ccae7bba4691f3</citedby><cites>FETCH-LOGICAL-c192t-31cdd0a8028a548c280a65f61b1c2506a6ea4305f63e139c8d8ccae7bba4691f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/398659$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/398659$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Bosiers, J.T.</creatorcontrib><creatorcontrib>Roks, E.</creatorcontrib><creatorcontrib>Peek, H.L.</creatorcontrib><creatorcontrib>Kleimann, A.C.</creatorcontrib><creatorcontrib>Van der Sijde, A.G.</creatorcontrib><title>An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>A Frame-Transfer CCD imager for consumer applications has been developed with low dark current by using hole accumulation at the entire Si-SiO/sub 2/ interface of the image pixel during integration, called "All-Gates Pinning", or AGP. All sensor features, such as vertical anti-blooming and electronic shutter are maintained. The sensor combines thin polysilicon electrodes with mosaic color filters for increased sensitivity and resolution, and uses minimized capacitances and a double metal technology for increased frame shift frequency to obtain low smear. The image pixel operation and optimization are presented, Measurements show a 30 times lower dark current, and 8 times lower fixed-pattern noise with all-gates pinning compared to a conventional device. A frame shift frequency of 15 MHz is achieved. These new features allow the reduction from 2/3" to 1/3" image format without sacrificing the performance.< ></description><subject>Capacitance</subject><subject>Capacitive sensors</subject><subject>Charge coupled devices</subject><subject>Colored noise</subject><subject>Dark current</subject><subject>Electrodes</subject><subject>Filters</subject><subject>Frequency</subject><subject>Pixel</subject><subject>Sensor phenomena and characterization</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><recordid>eNo9kMFLwzAYxYMoOKcHr56CB8FDt3xNmiXH0TknDDxs81rS9Ousdm1NWsb-eysdnj7e9348eI-Qe2ATAKanICdcKxnpCzKCKJoFWgp5SUaMgQo0V_ya3Hj_1UspRDgiu3lFN8HHakNtfWhMW6QlUpjyx16XtaPLbRDHC1oczB4dPRbtJy3rI82M-6a2cw6rlqYn6juXG4u0KaqqqPa35Co3pce78x2T3fJlG6-C9fvrWzxfBxZ02AYcbJYxo1ioTCSUDRUzMsolpGDDiEkj0QjO-g9H4NqqTFlrcJamRkgNOR-TpyG3cfVPh75NDoW3WJamwrrzSahEJJiSPfg8gNbV3jvMk8b1ndwpAZb8DZeATIbhevZhYAtE_OfO5i_QpWZK</recordid><startdate>19950801</startdate><enddate>19950801</enddate><creator>Bosiers, J.T.</creator><creator>Roks, E.</creator><creator>Peek, H.L.</creator><creator>Kleimann, A.C.</creator><creator>Van der Sijde, A.G.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19950801</creationdate><title>An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning</title><author>Bosiers, J.T. ; Roks, E. ; Peek, H.L. ; Kleimann, A.C. ; Van der Sijde, A.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c192t-31cdd0a8028a548c280a65f61b1c2506a6ea4305f63e139c8d8ccae7bba4691f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Capacitance</topic><topic>Capacitive sensors</topic><topic>Charge coupled devices</topic><topic>Colored noise</topic><topic>Dark current</topic><topic>Electrodes</topic><topic>Filters</topic><topic>Frequency</topic><topic>Pixel</topic><topic>Sensor phenomena and characterization</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bosiers, J.T.</creatorcontrib><creatorcontrib>Roks, E.</creatorcontrib><creatorcontrib>Peek, H.L.</creatorcontrib><creatorcontrib>Kleimann, A.C.</creatorcontrib><creatorcontrib>Van der Sijde, A.G.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bosiers, J.T.</au><au>Roks, E.</au><au>Peek, H.L.</au><au>Kleimann, A.C.</au><au>Van der Sijde, A.G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1995-08-01</date><risdate>1995</risdate><volume>42</volume><issue>8</issue><spage>1449</spage><epage>1460</epage><pages>1449-1460</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>A Frame-Transfer CCD imager for consumer applications has been developed with low dark current by using hole accumulation at the entire Si-SiO/sub 2/ interface of the image pixel during integration, called "All-Gates Pinning", or AGP. 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subjects | Capacitance Capacitive sensors Charge coupled devices Colored noise Dark current Electrodes Filters Frequency Pixel Sensor phenomena and characterization |
title | An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning |
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