A new Al-free HFET structure: The pseudomorphic p-InP/n-InP/In/sub 0.75/GaAs double heterostructure /spl delta/-doped HEMT
A new type of low pressure metal organic vapor epitaxial grown high electron mobility transistor (HEMT) device is reported. By using only a strained In/sub 0.75/Ga/sub 0.25/As quantum well (QW)-channel and InP as a carrier supplying n-type, /spl delta/-doped and barrier-enhancement p-type layers, a...
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creator | Kusters, A.M. Kohl, A. Brittner, S. Funke, T. Sommer, V. Heime, K. |
description | A new type of low pressure metal organic vapor epitaxial grown high electron mobility transistor (HEMT) device is reported. By using only a strained In/sub 0.75/Ga/sub 0.25/As quantum well (QW)-channel and InP as a carrier supplying n-type, /spl delta/-doped and barrier-enhancement p-type layers, a high performance pseudomorphic double heterostructure (DH)-HEMT has been created. The authors present the growth, device fabrication, material quality, and the DC- and RF-performance of 0.8 /spl mu/m-devices, which show extremely good characteristics. The approach described here may serve as an useful alternative to InAlAs containing structures because it eliminates many troublesome effects such as kinks, deep levels, interface states, high output conductances and gate leakages, which are attributed to a large extent to impurity-Al interactions.< > |
doi_str_mv | 10.1109/ICIPRM.1993.380581 |
format | Conference Proceeding |
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By using only a strained In/sub 0.75/Ga/sub 0.25/As quantum well (QW)-channel and InP as a carrier supplying n-type, /spl delta/-doped and barrier-enhancement p-type layers, a high performance pseudomorphic double heterostructure (DH)-HEMT has been created. The authors present the growth, device fabrication, material quality, and the DC- and RF-performance of 0.8 /spl mu/m-devices, which show extremely good characteristics. The approach described here may serve as an useful alternative to InAlAs containing structures because it eliminates many troublesome effects such as kinks, deep levels, interface states, high output conductances and gate leakages, which are attributed to a large extent to impurity-Al interactions.< ></description><identifier>ISBN: 9780780309937</identifier><identifier>ISBN: 0780309936</identifier><identifier>DOI: 10.1109/ICIPRM.1993.380581</identifier><language>eng</language><publisher>IEEE</publisher><subject>DH-HEMTs ; Doping ; Fabrication ; Gallium arsenide ; HEMTs ; Indium phosphide ; MODFETs ; Optical buffering ; Schottky barriers ; Schottky diodes</subject><ispartof>1993 (5th) International Conference on Indium Phosphide and Related Materials, 1993, p.473-476</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/380581$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4048,4049,27923,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/380581$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kusters, A.M.</creatorcontrib><creatorcontrib>Kohl, A.</creatorcontrib><creatorcontrib>Brittner, S.</creatorcontrib><creatorcontrib>Funke, T.</creatorcontrib><creatorcontrib>Sommer, V.</creatorcontrib><creatorcontrib>Heime, K.</creatorcontrib><title>A new Al-free HFET structure: The pseudomorphic p-InP/n-InP/In/sub 0.75/GaAs double heterostructure /spl delta/-doped HEMT</title><title>1993 (5th) International Conference on Indium Phosphide and Related Materials</title><addtitle>ICIPRM</addtitle><description>A new type of low pressure metal organic vapor epitaxial grown high electron mobility transistor (HEMT) device is reported. By using only a strained In/sub 0.75/Ga/sub 0.25/As quantum well (QW)-channel and InP as a carrier supplying n-type, /spl delta/-doped and barrier-enhancement p-type layers, a high performance pseudomorphic double heterostructure (DH)-HEMT has been created. The authors present the growth, device fabrication, material quality, and the DC- and RF-performance of 0.8 /spl mu/m-devices, which show extremely good characteristics. The approach described here may serve as an useful alternative to InAlAs containing structures because it eliminates many troublesome effects such as kinks, deep levels, interface states, high output conductances and gate leakages, which are attributed to a large extent to impurity-Al interactions.< ></description><subject>DH-HEMTs</subject><subject>Doping</subject><subject>Fabrication</subject><subject>Gallium arsenide</subject><subject>HEMTs</subject><subject>Indium phosphide</subject><subject>MODFETs</subject><subject>Optical buffering</subject><subject>Schottky barriers</subject><subject>Schottky diodes</subject><isbn>9780780309937</isbn><isbn>0780309936</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9T8GKwjAUDCzCLtof6On9QJuEbGnrrYhrexBEei_VvNJKbELSsOx-vUXFo8MwA_PgDUNIyFnMOctptakOx33M81zEImNJxj9IkKcZmynYnKafJHDuwmZ8J1yw7Iv8FzDiLxQq6iwilD_bGtxk_XnyFtdQ9wjGoZf6qq3phzOYqBoPdLxrNVLnT8DiNKG7tnAgtT8phB4ntPr1BqgzCiSqqaWR1AYllNt9vSKLrlUOg6cvSTi3b8poQMTG2OHa2r_mMUS8Pd4AJO1LiQ</recordid><startdate>1993</startdate><enddate>1993</enddate><creator>Kusters, A.M.</creator><creator>Kohl, A.</creator><creator>Brittner, S.</creator><creator>Funke, T.</creator><creator>Sommer, V.</creator><creator>Heime, K.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>A new Al-free HFET structure: The pseudomorphic p-InP/n-InP/In/sub 0.75/GaAs double heterostructure /spl delta/-doped HEMT</title><author>Kusters, A.M. ; Kohl, A. ; Brittner, S. ; Funke, T. ; Sommer, V. ; Heime, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_3805813</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>DH-HEMTs</topic><topic>Doping</topic><topic>Fabrication</topic><topic>Gallium arsenide</topic><topic>HEMTs</topic><topic>Indium phosphide</topic><topic>MODFETs</topic><topic>Optical buffering</topic><topic>Schottky barriers</topic><topic>Schottky diodes</topic><toplevel>online_resources</toplevel><creatorcontrib>Kusters, A.M.</creatorcontrib><creatorcontrib>Kohl, A.</creatorcontrib><creatorcontrib>Brittner, S.</creatorcontrib><creatorcontrib>Funke, T.</creatorcontrib><creatorcontrib>Sommer, V.</creatorcontrib><creatorcontrib>Heime, K.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kusters, A.M.</au><au>Kohl, A.</au><au>Brittner, S.</au><au>Funke, T.</au><au>Sommer, V.</au><au>Heime, K.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A new Al-free HFET structure: The pseudomorphic p-InP/n-InP/In/sub 0.75/GaAs double heterostructure /spl delta/-doped HEMT</atitle><btitle>1993 (5th) International Conference on Indium Phosphide and Related Materials</btitle><stitle>ICIPRM</stitle><date>1993</date><risdate>1993</risdate><spage>473</spage><epage>476</epage><pages>473-476</pages><isbn>9780780309937</isbn><isbn>0780309936</isbn><abstract>A new type of low pressure metal organic vapor epitaxial grown high electron mobility transistor (HEMT) device is reported. By using only a strained In/sub 0.75/Ga/sub 0.25/As quantum well (QW)-channel and InP as a carrier supplying n-type, /spl delta/-doped and barrier-enhancement p-type layers, a high performance pseudomorphic double heterostructure (DH)-HEMT has been created. The authors present the growth, device fabrication, material quality, and the DC- and RF-performance of 0.8 /spl mu/m-devices, which show extremely good characteristics. The approach described here may serve as an useful alternative to InAlAs containing structures because it eliminates many troublesome effects such as kinks, deep levels, interface states, high output conductances and gate leakages, which are attributed to a large extent to impurity-Al interactions.< ></abstract><pub>IEEE</pub><doi>10.1109/ICIPRM.1993.380581</doi></addata></record> |
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ispartof | 1993 (5th) International Conference on Indium Phosphide and Related Materials, 1993, p.473-476 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | DH-HEMTs Doping Fabrication Gallium arsenide HEMTs Indium phosphide MODFETs Optical buffering Schottky barriers Schottky diodes |
title | A new Al-free HFET structure: The pseudomorphic p-InP/n-InP/In/sub 0.75/GaAs double heterostructure /spl delta/-doped HEMT |
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