Reliability of an infrared detecting system

Reliability of an infrared detecting system

The authors present a mathematical model to evaluate the reliability of a infrared detecting system. In many cases the reliability for a complex system cannot be determined with conventional models. Consequently, a combinatorial analysis method should be applied. For example, in a complex system suc...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Tung, S.S., Fun, Y.-p.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Failure analysis
Infrared detectors
Mathematical model
Military equipment
Noise figure
Optical sensors
Reliability engineering
Reliability theory
Signal processing
Wiring
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 439
container_issue
container_start_page 436
container_title
container_volume
creator Tung, S.S.
Fun, Y.-p.
description The authors present a mathematical model to evaluate the reliability of a infrared detecting system. In many cases the reliability for a complex system cannot be determined with conventional models. Consequently, a combinatorial analysis method should be applied. For example, in a complex system such as infrared systems, this is due to its complex wiring configuration and intricate failure criteria. Based on system configuration and failure criteria, a set of mathematical models has been derived in terms of classical reliability theory and combinatorial analysis. The simplest and most efficient way to apply combinatorial analysis in deriving mathematical models for this type of system is to use the principle of mathematical induction. Then a general analytical solution can be easily obtained. This solution is given in the mathematical proofs.< >
doi_str_mv 10.1109/ISUMA.1993.366732
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_366732</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>366732</ieee_id><sourcerecordid>366732</sourcerecordid><originalsourceid>FETCH-LOGICAL-i89t-30d3a88da9e4e18f9c69e2970994ecea5b1358c9dd2a7de762809ad75e507be83</originalsourceid><addsrcrecordid>eNotj8tKw0AUQAdEUGo-QFezl8SZzOveZSk-Ci2C1nW5ydzISBolM5v8vUI9m7M7cIS41arRWuHD9v1jv240ommM98G0F6LCAAo0eANOmStR5fyl_rDWWaevxf0bj4m6NKayyO9B0iTTNMw0c5SRC_clTZ8yL7nw6UZcDjRmrv69Eoenx8Pmpd69Pm83612dAEttVDQEEAnZsoYBe4_cYlCIlnsm12njoMcYWwqRg29BIcXg2KnQMZiVuDtnEzMff-Z0onk5nofML6CkQKs</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Reliability of an infrared detecting system</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Tung, S.S. ; Fun, Y.-p.</creator><creatorcontrib>Tung, S.S. ; Fun, Y.-p.</creatorcontrib><description>The authors present a mathematical model to evaluate the reliability of a infrared detecting system. In many cases the reliability for a complex system cannot be determined with conventional models. Consequently, a combinatorial analysis method should be applied. For example, in a complex system such as infrared systems, this is due to its complex wiring configuration and intricate failure criteria. Based on system configuration and failure criteria, a set of mathematical models has been derived in terms of classical reliability theory and combinatorial analysis. The simplest and most efficient way to apply combinatorial analysis in deriving mathematical models for this type of system is to use the principle of mathematical induction. Then a general analytical solution can be easily obtained. This solution is given in the mathematical proofs.&lt; &gt;</description><identifier>ISBN: 9780818638503</identifier><identifier>ISBN: 0818638508</identifier><identifier>DOI: 10.1109/ISUMA.1993.366732</identifier><language>eng</language><publisher>IEEE Comput. Soc. Press</publisher><subject>Failure analysis ; Infrared detectors ; Mathematical model ; Military equipment ; Noise figure ; Optical sensors ; Reliability engineering ; Reliability theory ; Signal processing ; Wiring</subject><ispartof>1993 (2nd) International Symposium on Uncertainty Modeling and Analysis, 1993, p.436-439</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/366732$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/366732$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Tung, S.S.</creatorcontrib><creatorcontrib>Fun, Y.-p.</creatorcontrib><title>Reliability of an infrared detecting system</title><title>1993 (2nd) International Symposium on Uncertainty Modeling and Analysis</title><addtitle>ISUMA</addtitle><description>The authors present a mathematical model to evaluate the reliability of a infrared detecting system. In many cases the reliability for a complex system cannot be determined with conventional models. Consequently, a combinatorial analysis method should be applied. For example, in a complex system such as infrared systems, this is due to its complex wiring configuration and intricate failure criteria. Based on system configuration and failure criteria, a set of mathematical models has been derived in terms of classical reliability theory and combinatorial analysis. The simplest and most efficient way to apply combinatorial analysis in deriving mathematical models for this type of system is to use the principle of mathematical induction. Then a general analytical solution can be easily obtained. This solution is given in the mathematical proofs.&lt; &gt;</description><subject>Failure analysis</subject><subject>Infrared detectors</subject><subject>Mathematical model</subject><subject>Military equipment</subject><subject>Noise figure</subject><subject>Optical sensors</subject><subject>Reliability engineering</subject><subject>Reliability theory</subject><subject>Signal processing</subject><subject>Wiring</subject><isbn>9780818638503</isbn><isbn>0818638508</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKw0AUQAdEUGo-QFezl8SZzOveZSk-Ci2C1nW5ydzISBolM5v8vUI9m7M7cIS41arRWuHD9v1jv240ommM98G0F6LCAAo0eANOmStR5fyl_rDWWaevxf0bj4m6NKayyO9B0iTTNMw0c5SRC_clTZ8yL7nw6UZcDjRmrv69Eoenx8Pmpd69Pm83612dAEttVDQEEAnZsoYBe4_cYlCIlnsm12njoMcYWwqRg29BIcXg2KnQMZiVuDtnEzMff-Z0onk5nofML6CkQKs</recordid><startdate>1993</startdate><enddate>1993</enddate><creator>Tung, S.S.</creator><creator>Fun, Y.-p.</creator><general>IEEE Comput. Soc. Press</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>Reliability of an infrared detecting system</title><author>Tung, S.S. ; Fun, Y.-p.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i89t-30d3a88da9e4e18f9c69e2970994ecea5b1358c9dd2a7de762809ad75e507be83</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Failure analysis</topic><topic>Infrared detectors</topic><topic>Mathematical model</topic><topic>Military equipment</topic><topic>Noise figure</topic><topic>Optical sensors</topic><topic>Reliability engineering</topic><topic>Reliability theory</topic><topic>Signal processing</topic><topic>Wiring</topic><toplevel>online_resources</toplevel><creatorcontrib>Tung, S.S.</creatorcontrib><creatorcontrib>Fun, Y.-p.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tung, S.S.</au><au>Fun, Y.-p.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Reliability of an infrared detecting system</atitle><btitle>1993 (2nd) International Symposium on Uncertainty Modeling and Analysis</btitle><stitle>ISUMA</stitle><date>1993</date><risdate>1993</risdate><spage>436</spage><epage>439</epage><pages>436-439</pages><isbn>9780818638503</isbn><isbn>0818638508</isbn><abstract>The authors present a mathematical model to evaluate the reliability of a infrared detecting system. In many cases the reliability for a complex system cannot be determined with conventional models. Consequently, a combinatorial analysis method should be applied. For example, in a complex system such as infrared systems, this is due to its complex wiring configuration and intricate failure criteria. Based on system configuration and failure criteria, a set of mathematical models has been derived in terms of classical reliability theory and combinatorial analysis. The simplest and most efficient way to apply combinatorial analysis in deriving mathematical models for this type of system is to use the principle of mathematical induction. Then a general analytical solution can be easily obtained. This solution is given in the mathematical proofs.&lt; &gt;</abstract><pub>IEEE Comput. Soc. Press</pub><doi>10.1109/ISUMA.1993.366732</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9780818638503
ispartof 1993 (2nd) International Symposium on Uncertainty Modeling and Analysis, 1993, p.436-439
issn
language eng
recordid cdi_ieee_primary_366732
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Failure analysis
Infrared detectors
Mathematical model
Military equipment
Noise figure
Optical sensors
Reliability engineering
Reliability theory
Signal processing
Wiring
title Reliability of an infrared detecting system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T07%3A43%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Reliability%20of%20an%20infrared%20detecting%20system&rft.btitle=1993%20(2nd)%20International%20Symposium%20on%20Uncertainty%20Modeling%20and%20Analysis&rft.au=Tung,%20S.S.&rft.date=1993&rft.spage=436&rft.epage=439&rft.pages=436-439&rft.isbn=9780818638503&rft.isbn_list=0818638508&rft_id=info:doi/10.1109/ISUMA.1993.366732&rft_dat=%3Cieee_6IE%3E366732%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=366732&rfr_iscdi=true