Set-up for measuring changes in the average size of wooden chips by microwave scattering

Set-up for measuring changes in the average size of wooden chips by microwave scattering

A set-up for measuring the average volume of wooden chips for particle board manufacturing is presented. The measurement is based on a dual-polarization forward scattering measurement combined with the free-space measurement of phase and attenuation. Laboratory measurements of the ratio of the avera...

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1. Verfasser: Toropainen, A.P.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Attenuation measurement
Laboratories
Particle measurements
Particle scattering
Permittivity measurement
Phase measurement
Pulp manufacturing
Semiconductor device measurement
Size measurement
Volume measurement
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description A set-up for measuring the average volume of wooden chips for particle board manufacturing is presented. The measurement is based on a dual-polarization forward scattering measurement combined with the free-space measurement of phase and attenuation. Laboratory measurements of the ratio of the average volumes of chips with different size distributions and permittivities are presented.< >
doi_str_mv 10.1109/MWSYM.1994.335173
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The measurement is based on a dual-polarization forward scattering measurement combined with the free-space measurement of phase and attenuation. Laboratory measurements of the ratio of the average volumes of chips with different size distributions and permittivities are presented.&lt; &gt;</description><identifier>ISSN: 0149-645X</identifier><identifier>ISBN: 0780317785</identifier><identifier>ISBN: 9780780317789</identifier><identifier>EISSN: 2576-7216</identifier><identifier>DOI: 10.1109/MWSYM.1994.335173</identifier><language>eng</language><publisher>IEEE</publisher><subject>Attenuation measurement ; Laboratories ; Particle measurements ; Particle scattering ; Permittivity measurement ; Phase measurement ; Pulp manufacturing ; Semiconductor device measurement ; Size measurement ; Volume measurement</subject><ispartof>1994 IEEE MTT-S International Microwave Symposium Digest (Cat. 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The measurement is based on a dual-polarization forward scattering measurement combined with the free-space measurement of phase and attenuation. Laboratory measurements of the ratio of the average volumes of chips with different size distributions and permittivities are presented.&lt; &gt;</description><subject>Attenuation measurement</subject><subject>Laboratories</subject><subject>Particle measurements</subject><subject>Particle scattering</subject><subject>Permittivity measurement</subject><subject>Phase measurement</subject><subject>Pulp manufacturing</subject><subject>Semiconductor device measurement</subject><subject>Size measurement</subject><subject>Volume measurement</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>0780317785</isbn><isbn>9780780317789</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1994</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkMlOwzAUAC0WibTwAXDyDyT4xbGfc0QVm9SKQ0GUU-U4L6kRWRSnVOXrKSqnuYzmMIxdg0gARH67eF9-LBLI8yyRUgHKExalCnWMKehTNhFohAREo85YJCDLY52p1QWbhPAphFAGdMRWSxrjbc-rbuAN2bAdfFtzt7FtTYH7lo8b4vabBlsTD_6HeFfxXdeV1B4s3wde7Hnj3dDtDhYPzo4j_TUu2XllvwJd_XPK3h7uX2dP8fzl8Xl2N489YDrGTukMRQUStXBIopClSitVklJ5agw6WYJGVRbkoMg0GqRSmkyDkUo7IjllN8euJ6J1P_jGDvv1cYj8Bc-5U04</recordid><startdate>1994</startdate><enddate>1994</enddate><creator>Toropainen, A.P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1994</creationdate><title>Set-up for measuring changes in the average size of wooden chips by microwave scattering</title><author>Toropainen, A.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-c56470f13760c7e0b3d52f5de5592887c3d1675dbec1b46787ed384618356cee3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Attenuation measurement</topic><topic>Laboratories</topic><topic>Particle measurements</topic><topic>Particle scattering</topic><topic>Permittivity measurement</topic><topic>Phase measurement</topic><topic>Pulp manufacturing</topic><topic>Semiconductor device measurement</topic><topic>Size measurement</topic><topic>Volume measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Toropainen, A.P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Toropainen, A.P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Set-up for measuring changes in the average size of wooden chips by microwave scattering</atitle><btitle>1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4)</btitle><stitle>MWSYM</stitle><date>1994</date><risdate>1994</risdate><spage>1057</spage><epage>1060 vol.2</epage><pages>1057-1060 vol.2</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>0780317785</isbn><isbn>9780780317789</isbn><abstract>A set-up for measuring the average volume of wooden chips for particle board manufacturing is presented. The measurement is based on a dual-polarization forward scattering measurement combined with the free-space measurement of phase and attenuation. Laboratory measurements of the ratio of the average volumes of chips with different size distributions and permittivities are presented.&lt; &gt;</abstract><pub>IEEE</pub><doi>10.1109/MWSYM.1994.335173</doi></addata></record>
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identifier ISSN: 0149-645X
ispartof 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4), 1994, p.1057-1060 vol.2
issn 0149-645X
2576-7216
language eng
recordid cdi_ieee_primary_335173
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Attenuation measurement
Laboratories
Particle measurements
Particle scattering
Permittivity measurement
Phase measurement
Pulp manufacturing
Semiconductor device measurement
Size measurement
Volume measurement
title Set-up for measuring changes in the average size of wooden chips by microwave scattering
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