A microstrip phase-trim device using a dielectric overlay
A design procedure is given for a microstrip phase-trim device using a dielectric overlay on a conventional microstrip line. The physical operation of the device is based on the change in the effective dielectric constant of the microstrip line caused by the presence of the dielectric layer on top o...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1994-11, Vol.42 (11), p.2023-2026 |
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| container_end_page | 2026 |
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| container_issue | 11 |
| container_start_page | 2023 |
| container_title | IEEE transactions on microwave theory and techniques |
| container_volume | 42 |
| creator | Couker, M.A. Kushner, L.J. |
| description | A design procedure is given for a microstrip phase-trim device using a dielectric overlay on a conventional microstrip line. The physical operation of the device is based on the change in the effective dielectric constant of the microstrip line caused by the presence of the dielectric layer on top of the microstrip line. The amount of phase trim produced by the device can be selected by the appropriate choice of dielectric constant, height, and length of the dielectric overlay. An approximate expression is given for the effective dielectric constant of the microstrip line as a function of the dielectric constant and height of the overlay. Measured results at 10 GHz are compared with predicted performance.< > |
| doi_str_mv | 10.1109/22.330113 |
| format | Article |
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The physical operation of the device is based on the change in the effective dielectric constant of the microstrip line caused by the presence of the dielectric layer on top of the microstrip line. The amount of phase trim produced by the device can be selected by the appropriate choice of dielectric constant, height, and length of the dielectric overlay. An approximate expression is given for the effective dielectric constant of the microstrip line as a function of the dielectric constant and height of the overlay. Measured results at 10 GHz are compared with predicted performance.< ></description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/22.330113</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Capacitance ; Circuits ; Design. Technologies. Operation analysis. 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The physical operation of the device is based on the change in the effective dielectric constant of the microstrip line caused by the presence of the dielectric layer on top of the microstrip line. The amount of phase trim produced by the device can be selected by the appropriate choice of dielectric constant, height, and length of the dielectric overlay. An approximate expression is given for the effective dielectric constant of the microstrip line as a function of the dielectric constant and height of the overlay. Measured results at 10 GHz are compared with predicted performance.< ></description><subject>Applied sciences</subject><subject>Capacitance</subject><subject>Circuits</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Dielectric constant</subject><subject>Dielectric devices</subject><subject>Dielectric measurements</subject><subject>Dielectric substrates</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Impedance</subject><subject>Integrated circuits</subject><subject>Manufacturing</subject><subject>Microstrip</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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Technologies. Operation analysis. Testing</topic><topic>Dielectric constant</topic><topic>Dielectric devices</topic><topic>Dielectric measurements</topic><topic>Dielectric substrates</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Impedance</topic><topic>Integrated circuits</topic><topic>Manufacturing</topic><topic>Microstrip</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Transmission line measurements</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Couker, M.A.</creatorcontrib><creatorcontrib>Kushner, L.J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Couker, M.A.</au><au>Kushner, L.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A microstrip phase-trim device using a dielectric overlay</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1994-11-01</date><risdate>1994</risdate><volume>42</volume><issue>11</issue><spage>2023</spage><epage>2026</epage><pages>2023-2026</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>A design procedure is given for a microstrip phase-trim device using a dielectric overlay on a conventional microstrip line. The physical operation of the device is based on the change in the effective dielectric constant of the microstrip line caused by the presence of the dielectric layer on top of the microstrip line. The amount of phase trim produced by the device can be selected by the appropriate choice of dielectric constant, height, and length of the dielectric overlay. An approximate expression is given for the effective dielectric constant of the microstrip line as a function of the dielectric constant and height of the overlay. Measured results at 10 GHz are compared with predicted performance.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/22.330113</doi><tpages>4</tpages></addata></record> |
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| ispartof | IEEE transactions on microwave theory and techniques, 1994-11, Vol.42 (11), p.2023-2026 |
| issn | 0018-9480 1557-9670 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Capacitance Circuits Design. Technologies. Operation analysis. Testing Dielectric constant Dielectric devices Dielectric measurements Dielectric substrates Electronics Exact sciences and technology Impedance Integrated circuits Manufacturing Microstrip Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transmission line measurements |
| title | A microstrip phase-trim device using a dielectric overlay |
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