Combining sneak circuit analysis and failure modes and effects analysis
The feasibility of integrating failure modes and effects analysis (FMEA) and sneak circuit analysis (SCA) into a comprehensive reliability analysis technique is examined especially from the perspective of automation. FMEA looks at a system's strengths and weaknesses; SCA looks for latent circui...
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creator | Savakoor, D.S. Bowles, J.B. Bonnell, R.D. |
description | The feasibility of integrating failure modes and effects analysis (FMEA) and sneak circuit analysis (SCA) into a comprehensive reliability analysis technique is examined especially from the perspective of automation. FMEA looks at a system's strengths and weaknesses; SCA looks for latent circuit conditions which may lead to unplanned or unexpected modes of operation. The goals of the two techniques complement each other and their combination results in a more comprehensive analysis than either technique alone can achieve. The rich collection of heuristics used in SCA can be applied to design validation and also used as guidelines at various stages of system design. At both the functional level and the component level, the combined analysis is done using the same circuit representation as for the SCA and for the FMEA, and draws on the same database.< > |
doi_str_mv | 10.1109/RAMS.1993.296855 |
format | Conference Proceeding |
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FMEA looks at a system's strengths and weaknesses; SCA looks for latent circuit conditions which may lead to unplanned or unexpected modes of operation. The goals of the two techniques complement each other and their combination results in a more comprehensive analysis than either technique alone can achieve. The rich collection of heuristics used in SCA can be applied to design validation and also used as guidelines at various stages of system design. At both the functional level and the component level, the combined analysis is done using the same circuit representation as for the SCA and for the FMEA, and draws on the same database.< ></description><subject>Automation</subject><subject>Circuit analysis</subject><subject>Circuit testing</subject><subject>Failure analysis</subject><subject>Guidelines</subject><subject>Integrated circuit reliability</subject><subject>Performance analysis</subject><subject>Robustness</subject><subject>System analysis and design</subject><isbn>078030943X</isbn><isbn>9780780309432</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9j09LxDAUxAMiqOvexVO_QOtLkzTJcSm6LqwI_gFvy0vyItG2K033sN_ehYpzmeHHMDCM3XCoOAd797J6eq24taKqbWOUOmNXoA0IsFJ8XLBlzl9wklJGS7hk63bfuzSk4bPIA-F34dPoD2kqcMDumFM-hVBETN1hpKLfB5oJxUh-yv-1a3Yescu0_PMFe3-4f2sfy-3zetOutmXiup5KNEIGSdhYAR6DRh41ORssKWM5r2shiUyIJkDDTYwgyKGXTXTeCZBeLNjtvJuIaPczph7H426-Kn4BR29LLA</recordid><startdate>1993</startdate><enddate>1993</enddate><creator>Savakoor, D.S.</creator><creator>Bowles, J.B.</creator><creator>Bonnell, R.D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>Combining sneak circuit analysis and failure modes and effects analysis</title><author>Savakoor, D.S. ; Bowles, J.B. ; Bonnell, R.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-a834d4ea6930cad7a1f7eb9d9e589112234ee8df8d0618ff03ebac46fbcb304c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Automation</topic><topic>Circuit analysis</topic><topic>Circuit testing</topic><topic>Failure analysis</topic><topic>Guidelines</topic><topic>Integrated circuit reliability</topic><topic>Performance analysis</topic><topic>Robustness</topic><topic>System analysis and design</topic><toplevel>online_resources</toplevel><creatorcontrib>Savakoor, D.S.</creatorcontrib><creatorcontrib>Bowles, J.B.</creatorcontrib><creatorcontrib>Bonnell, R.D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Savakoor, D.S.</au><au>Bowles, J.B.</au><au>Bonnell, R.D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Combining sneak circuit analysis and failure modes and effects analysis</atitle><btitle>Annual Reliability and Maintainability Symposium 1993 Proceedings</btitle><stitle>RAMS</stitle><date>1993</date><risdate>1993</risdate><spage>199</spage><epage>205</epage><pages>199-205</pages><isbn>078030943X</isbn><isbn>9780780309432</isbn><abstract>The feasibility of integrating failure modes and effects analysis (FMEA) and sneak circuit analysis (SCA) into a comprehensive reliability analysis technique is examined especially from the perspective of automation. FMEA looks at a system's strengths and weaknesses; SCA looks for latent circuit conditions which may lead to unplanned or unexpected modes of operation. The goals of the two techniques complement each other and their combination results in a more comprehensive analysis than either technique alone can achieve. The rich collection of heuristics used in SCA can be applied to design validation and also used as guidelines at various stages of system design. At both the functional level and the component level, the combined analysis is done using the same circuit representation as for the SCA and for the FMEA, and draws on the same database.< ></abstract><pub>IEEE</pub><doi>10.1109/RAMS.1993.296855</doi><tpages>7</tpages></addata></record> |
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identifier | ISBN: 078030943X |
ispartof | Annual Reliability and Maintainability Symposium 1993 Proceedings, 1993, p.199-205 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Automation Circuit analysis Circuit testing Failure analysis Guidelines Integrated circuit reliability Performance analysis Robustness System analysis and design |
title | Combining sneak circuit analysis and failure modes and effects analysis |
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