Bifurcation evolution across metal-metal contacts sustaining high charge injection rates
In real world even the simplest of the electrical components may exhibit unpredictable characteristics, and it seems that the theory of chaos touches all disciplines. In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are...
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Veröffentlicht in: | IEEE transactions on components, packaging, and manufacturing technology. Part A packaging, and manufacturing technology. Part A, 1994-06, Vol.17 (2), p.286-294 |
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container_title | IEEE transactions on components, packaging, and manufacturing technology. Part A |
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creator | Dervos, C.T. Fitsilis, P.T. |
description | In real world even the simplest of the electrical components may exhibit unpredictable characteristics, and it seems that the theory of chaos touches all disciplines. In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are experimentally investigated in an I-V phase space using state-of-the-art data logging systems. The mechanically contacted metals are energized by a sinusoidal power source, and their response is systematically studied within a 50-Hz cycle. The obtained results convincingly demonstrate their chaotic nature. Two entirely different instability types have been observed for such systems. Their classification may lead to a better understanding of negative differential resistance (NDR) formation, which is frequently observed across highly injecting interfaces. An equivalent circuit for the examined dynamic system is provided, and an effective test for the industrial no-load switching contacts is proposed.< > |
doi_str_mv | 10.1109/95.296412 |
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In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are experimentally investigated in an I-V phase space using state-of-the-art data logging systems. The mechanically contacted metals are energized by a sinusoidal power source, and their response is systematically studied within a 50-Hz cycle. The obtained results convincingly demonstrate their chaotic nature. Two entirely different instability types have been observed for such systems. Their classification may lead to a better understanding of negative differential resistance (NDR) formation, which is frequently observed across highly injecting interfaces. An equivalent circuit for the examined dynamic system is provided, and an effective test for the industrial no-load switching contacts is proposed.< ></description><identifier>ISSN: 1070-9886</identifier><identifier>EISSN: 1558-3678</identifier><identifier>DOI: 10.1109/95.296412</identifier><identifier>CODEN: IMTAEZ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bifurcation ; Chaos ; Circuit testing ; Connectors ; Contacts ; Metal-insulator structures ; Power engineering and energy ; Switches ; Switching circuits ; Temperature</subject><ispartof>IEEE transactions on components, packaging, and manufacturing technology. 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Part A</title><addtitle>T-CPMA</addtitle><description>In real world even the simplest of the electrical components may exhibit unpredictable characteristics, and it seems that the theory of chaos touches all disciplines. In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are experimentally investigated in an I-V phase space using state-of-the-art data logging systems. The mechanically contacted metals are energized by a sinusoidal power source, and their response is systematically studied within a 50-Hz cycle. The obtained results convincingly demonstrate their chaotic nature. Two entirely different instability types have been observed for such systems. Their classification may lead to a better understanding of negative differential resistance (NDR) formation, which is frequently observed across highly injecting interfaces. An equivalent circuit for the examined dynamic system is provided, and an effective test for the industrial no-load switching contacts is proposed.< ></description><subject>Bifurcation</subject><subject>Chaos</subject><subject>Circuit testing</subject><subject>Connectors</subject><subject>Contacts</subject><subject>Metal-insulator structures</subject><subject>Power engineering and energy</subject><subject>Switches</subject><subject>Switching circuits</subject><subject>Temperature</subject><issn>1070-9886</issn><issn>1558-3678</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1994</creationdate><recordtype>article</recordtype><recordid>eNo9kM1LxDAQxYMouK4evHrK1UPXJG2-jrr4BQteFLyVNJm2WbqtJKngf29tFy_zHsxvhsdD6JqSDaVE32m-YVoUlJ2gFeVcZbmQ6nTyRJJMKyXO0UWMe0JooThdoc8HX4_BmuSHHsP30I2zMzYMMeIDJNNl88R26JOxKeI4xmR87_sGt75psW1NaAD7fg92Pg4mQbxEZ7XpIlwddY0-nh7fty_Z7u35dXu_yywrRMpcrcA5IrUkVvDKMecqXSngRhMhGa-pq0BywhmVBFTOhDCCq0k4q3XB8jW6Xf7OiQPU5VfwBxN-SkrKv0pKzculkom9WVgPAP_ccfkLz3JdDg</recordid><startdate>19940601</startdate><enddate>19940601</enddate><creator>Dervos, C.T.</creator><creator>Fitsilis, P.T.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19940601</creationdate><title>Bifurcation evolution across metal-metal contacts sustaining high charge injection rates</title><author>Dervos, C.T. ; Fitsilis, P.T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c246t-df8edd07970c65bd2ddb9b8e5a906725f1dbe75052170e83266a65826652f9423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Bifurcation</topic><topic>Chaos</topic><topic>Circuit testing</topic><topic>Connectors</topic><topic>Contacts</topic><topic>Metal-insulator structures</topic><topic>Power engineering and energy</topic><topic>Switches</topic><topic>Switching circuits</topic><topic>Temperature</topic><toplevel>online_resources</toplevel><creatorcontrib>Dervos, C.T.</creatorcontrib><creatorcontrib>Fitsilis, P.T.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on components, packaging, and manufacturing technology. Part A</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dervos, C.T.</au><au>Fitsilis, P.T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bifurcation evolution across metal-metal contacts sustaining high charge injection rates</atitle><jtitle>IEEE transactions on components, packaging, and manufacturing technology. Part A</jtitle><stitle>T-CPMA</stitle><date>1994-06-01</date><risdate>1994</risdate><volume>17</volume><issue>2</issue><spage>286</spage><epage>294</epage><pages>286-294</pages><issn>1070-9886</issn><eissn>1558-3678</eissn><coden>IMTAEZ</coden><abstract>In real world even the simplest of the electrical components may exhibit unpredictable characteristics, and it seems that the theory of chaos touches all disciplines. In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are experimentally investigated in an I-V phase space using state-of-the-art data logging systems. The mechanically contacted metals are energized by a sinusoidal power source, and their response is systematically studied within a 50-Hz cycle. The obtained results convincingly demonstrate their chaotic nature. Two entirely different instability types have been observed for such systems. Their classification may lead to a better understanding of negative differential resistance (NDR) formation, which is frequently observed across highly injecting interfaces. An equivalent circuit for the examined dynamic system is provided, and an effective test for the industrial no-load switching contacts is proposed.< ></abstract><pub>IEEE</pub><doi>10.1109/95.296412</doi><tpages>9</tpages></addata></record> |
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subjects | Bifurcation Chaos Circuit testing Connectors Contacts Metal-insulator structures Power engineering and energy Switches Switching circuits Temperature |
title | Bifurcation evolution across metal-metal contacts sustaining high charge injection rates |
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