Advanced materials for high energy density capacitors
Four different approaches to develop materials for high-energy-density and high-voltage capacitors are presented: diamond like carbon films, chemically vapor deposited diamonds films, ULTEM polyetherimide films, and computer-modeled modified polyetherimide films. Following a brief discussion of the...
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creator | Rzad, S.J. Gasworth, S.M. Reed, C.W. DeVre, M.W. |
description | Four different approaches to develop materials for high-energy-density and high-voltage capacitors are presented: diamond like carbon films, chemically vapor deposited diamonds films, ULTEM polyetherimide films, and computer-modeled modified polyetherimide films. Following a brief discussion of the state-of-the-art, the status of the work on these materials is presented, which includes measurements of resistivity, dielectric constant and loss, and breakdown strength. The results are very encouraging and suggest that energy densities of 4-15 J/cm/sup 3/ are possible.< > |
doi_str_mv | 10.1109/IPSS.1992.281982 |
format | Conference Proceeding |
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Following a brief discussion of the state-of-the-art, the status of the work on these materials is presented, which includes measurements of resistivity, dielectric constant and loss, and breakdown strength. The results are very encouraging and suggest that energy densities of 4-15 J/cm/sup 3/ are possible.< ></description><identifier>ISBN: 9780780305526</identifier><identifier>ISBN: 0780305523</identifier><identifier>DOI: 10.1109/IPSS.1992.281982</identifier><language>eng ; jpn</language><publisher>IEEE</publisher><subject>Capacitors ; Chemicals ; Conductivity ; Diamond-like carbon ; Dielectric constant ; Dielectric loss measurement ; Dielectric materials ; Dielectric measurements ; Loss measurement ; Organic materials</subject><ispartof>IEEE 35th International Power Sources Symposium, 1992, p.358-362</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/281982$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/281982$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rzad, S.J.</creatorcontrib><creatorcontrib>Gasworth, S.M.</creatorcontrib><creatorcontrib>Reed, C.W.</creatorcontrib><creatorcontrib>DeVre, M.W.</creatorcontrib><title>Advanced materials for high energy density capacitors</title><title>IEEE 35th International Power Sources Symposium</title><addtitle>IPSS</addtitle><description>Four different approaches to develop materials for high-energy-density and high-voltage capacitors are presented: diamond like carbon films, chemically vapor deposited diamonds films, ULTEM polyetherimide films, and computer-modeled modified polyetherimide films. Following a brief discussion of the state-of-the-art, the status of the work on these materials is presented, which includes measurements of resistivity, dielectric constant and loss, and breakdown strength. The results are very encouraging and suggest that energy densities of 4-15 J/cm/sup 3/ are possible.< ></description><subject>Capacitors</subject><subject>Chemicals</subject><subject>Conductivity</subject><subject>Diamond-like carbon</subject><subject>Dielectric constant</subject><subject>Dielectric loss measurement</subject><subject>Dielectric materials</subject><subject>Dielectric measurements</subject><subject>Loss measurement</subject><subject>Organic materials</subject><isbn>9780780305526</isbn><isbn>0780305523</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1992</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tqwzAURAWl0JJ6X7rSD9i9kqzHXYbQRyCQQtp1kKWrRKVxgmwK_vsa0mHgbIYDw9ijgEYIwOf1x27XCETZSCfQyRtWoXUwV4HW0tyxahi-YY7WzqC5Z3oZf30fKPKTH6lk_zPwdC78mA9HTj2Vw8Qj9UMeJx78xYc8nsvwwG7TvKTqnwv29fryuXqvN9u39Wq5qbPQeqytVc5a1B210qsWhekQZDAxGFSALnXeCDTSCy0cpDZh0tBRjB2ANMGqBXu6ejMR7S8ln3yZ9tdv6g96F0Nx</recordid><startdate>1992</startdate><enddate>1992</enddate><creator>Rzad, S.J.</creator><creator>Gasworth, S.M.</creator><creator>Reed, C.W.</creator><creator>DeVre, M.W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1992</creationdate><title>Advanced materials for high energy density capacitors</title><author>Rzad, S.J. ; Gasworth, S.M. ; Reed, C.W. ; DeVre, M.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i155t-77387795be42a34916b902c6dc693098fba61962a15180f4f9f50beddb0026c73</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng ; jpn</language><creationdate>1992</creationdate><topic>Capacitors</topic><topic>Chemicals</topic><topic>Conductivity</topic><topic>Diamond-like carbon</topic><topic>Dielectric constant</topic><topic>Dielectric loss measurement</topic><topic>Dielectric materials</topic><topic>Dielectric measurements</topic><topic>Loss measurement</topic><topic>Organic materials</topic><toplevel>online_resources</toplevel><creatorcontrib>Rzad, S.J.</creatorcontrib><creatorcontrib>Gasworth, S.M.</creatorcontrib><creatorcontrib>Reed, C.W.</creatorcontrib><creatorcontrib>DeVre, M.W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rzad, S.J.</au><au>Gasworth, S.M.</au><au>Reed, C.W.</au><au>DeVre, M.W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Advanced materials for high energy density capacitors</atitle><btitle>IEEE 35th International Power Sources Symposium</btitle><stitle>IPSS</stitle><date>1992</date><risdate>1992</risdate><spage>358</spage><epage>362</epage><pages>358-362</pages><isbn>9780780305526</isbn><isbn>0780305523</isbn><abstract>Four different approaches to develop materials for high-energy-density and high-voltage capacitors are presented: diamond like carbon films, chemically vapor deposited diamonds films, ULTEM polyetherimide films, and computer-modeled modified polyetherimide films. Following a brief discussion of the state-of-the-art, the status of the work on these materials is presented, which includes measurements of resistivity, dielectric constant and loss, and breakdown strength. The results are very encouraging and suggest that energy densities of 4-15 J/cm/sup 3/ are possible.< ></abstract><pub>IEEE</pub><doi>10.1109/IPSS.1992.281982</doi><tpages>5</tpages></addata></record> |
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language | eng ; jpn |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Capacitors Chemicals Conductivity Diamond-like carbon Dielectric constant Dielectric loss measurement Dielectric materials Dielectric measurements Loss measurement Organic materials |
title | Advanced materials for high energy density capacitors |
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