A new method of capacitance measurement
Three circuits for measuring capacitors are presented. These circuits form a sequence in that each succeeding circuit is an improvement in comparison with the previous one. Each circuit employs a rectifier, and each circuit is excited by a square-wave voltage. Analyses are provided, and sensitivitie...
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creator | Aronhime, P. Cecil, G. |
description | Three circuits for measuring capacitors are presented. These circuits form a sequence in that each succeeding circuit is an improvement in comparison with the previous one. Each circuit employs a rectifier, and each circuit is excited by a square-wave voltage. Analyses are provided, and sensitivities and laboratory results are given.< > |
doi_str_mv | 10.1109/MWSCAS.1992.271223 |
format | Conference Proceeding |
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These circuits form a sequence in that each succeeding circuit is an improvement in comparison with the previous one. Each circuit employs a rectifier, and each circuit is excited by a square-wave voltage. Analyses are provided, and sensitivities and laboratory results are given.< ></description><identifier>ISBN: 9780780305106</identifier><identifier>ISBN: 0780305108</identifier><identifier>DOI: 10.1109/MWSCAS.1992.271223</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance measurement ; Capacitors ; Diodes ; Electric variables measurement ; Integrated circuit measurements ; Laboratories ; Resistors ; Steady-state ; Switches ; Voltage</subject><ispartof>[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems, 1992, p.718-721 vol.1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/271223$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,4035,4036,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/271223$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Aronhime, P.</creatorcontrib><creatorcontrib>Cecil, G.</creatorcontrib><title>A new method of capacitance measurement</title><title>[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems</title><addtitle>MWSCAS</addtitle><description>Three circuits for measuring capacitors are presented. These circuits form a sequence in that each succeeding circuit is an improvement in comparison with the previous one. Each circuit employs a rectifier, and each circuit is excited by a square-wave voltage. Analyses are provided, and sensitivities and laboratory results are given.< ></description><subject>Capacitance measurement</subject><subject>Capacitors</subject><subject>Diodes</subject><subject>Electric variables measurement</subject><subject>Integrated circuit measurements</subject><subject>Laboratories</subject><subject>Resistors</subject><subject>Steady-state</subject><subject>Switches</subject><subject>Voltage</subject><isbn>9780780305106</isbn><isbn>0780305108</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1992</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tqwzAURAWlkJD6B7LyLiu7urp6Lo3pCxK6SEOWQZauiEvtBNul9O9rSIcDA2cxMIytgZcA3D3ujvu62pfgnCiFASHwjmXOWD6DXAHXC5aN4yefIxWAcEu2qfKefvKOpvMl5peUB3_1oZ18H2i2fvweqKN-emD3yX-NlP33ih2enz7q12L7_vJWV9uiBSOnQsuAImhHqKMmS2h1EwklGjLYqGRTnFUwKgUlPKXGaaKorJBgGnQJV2x9222J6HQd2s4Pv6fbG_wDoHw_Zg</recordid><startdate>1992</startdate><enddate>1992</enddate><creator>Aronhime, P.</creator><creator>Cecil, G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1992</creationdate><title>A new method of capacitance measurement</title><author>Aronhime, P. ; Cecil, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i174t-64c32c69e36d6e8e386bde3437e73b5f8fd386c75fc52aefb96eed582417b39f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Capacitance measurement</topic><topic>Capacitors</topic><topic>Diodes</topic><topic>Electric variables measurement</topic><topic>Integrated circuit measurements</topic><topic>Laboratories</topic><topic>Resistors</topic><topic>Steady-state</topic><topic>Switches</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Aronhime, P.</creatorcontrib><creatorcontrib>Cecil, G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Aronhime, P.</au><au>Cecil, G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A new method of capacitance measurement</atitle><btitle>[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems</btitle><stitle>MWSCAS</stitle><date>1992</date><risdate>1992</risdate><spage>718</spage><epage>721 vol.1</epage><pages>718-721 vol.1</pages><isbn>9780780305106</isbn><isbn>0780305108</isbn><abstract>Three circuits for measuring capacitors are presented. These circuits form a sequence in that each succeeding circuit is an improvement in comparison with the previous one. Each circuit employs a rectifier, and each circuit is excited by a square-wave voltage. Analyses are provided, and sensitivities and laboratory results are given.< ></abstract><pub>IEEE</pub><doi>10.1109/MWSCAS.1992.271223</doi></addata></record> |
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identifier | ISBN: 9780780305106 |
ispartof | [1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems, 1992, p.718-721 vol.1 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Capacitance measurement Capacitors Diodes Electric variables measurement Integrated circuit measurements Laboratories Resistors Steady-state Switches Voltage |
title | A new method of capacitance measurement |
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