Automatic test knowledge extraction from VHDL (ATKET)

The authors describe ATKET (automatic test knowledge extraction tool), which synthesizes test knowledge using structural and behavioral information available in the very high-speed IC description language (VHDL) description of a design. A VHDL analyzer produces an intermediate representation of the...

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Bibliographische Detailangaben

Hauptverfasser:	Vishakantaiah, P., Abraham, J., Abadir, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Automation Circuit faults Circuit testing Data mining Design engineering Jacobian matrices Microelectronics Sequential analysis Switches
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