Investigation of scandate cathodes: emission, fabrication, and activation processes

Investigation of scandate cathodes: emission, fabrication, and activation processes

Top-layer cathodes have been shown to exhibit work function values in the 1.5-eV range near 1100 K. Emission from cathodes made by sputter deposition of a Sc/sub 2/O/sub 3//W layer on top of an impregnated cathode were limited by the deposition conditions that cause dissociation of Sc/sub 2/O/sub 3/...

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Veröffentlicht in:IEEE transactions on electron devices 1989-01, Vol.36 (1), p.209-214
Hauptverfasser: Gibson, J.W., Haas, G.A., Thomas, R.E.
Format: Artikel
Sprache:eng
Schlagworte:
Cathodes
Extrapolation
Fabrication
Geometry
Laboratories
Plugs
Sputtering
Temperature
Testing
Thermionic emission
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container_title IEEE transactions on electron devices
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creator Gibson, J.W.
Haas, G.A.
Thomas, R.E.
description Top-layer cathodes have been shown to exhibit work function values in the 1.5-eV range near 1100 K. Emission from cathodes made by sputter deposition of a Sc/sub 2/O/sub 3//W layer on top of an impregnated cathode were limited by the deposition conditions that cause dissociation of Sc/sub 2/O/sub 3/ and/or formation of volatile oxides of W. Pure Sc/sub 2/O/sub 3/ layers were also activated by an external Ba source to the value of the work function reported above. These results and activation mechanisms and characteristics that are peculiar to the Ba-O-Sc surface are discussed.< >
doi_str_mv 10.1109/16.21207
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_21207</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>21207</ieee_id><sourcerecordid>25357276</sourcerecordid><originalsourceid>FETCH-LOGICAL-c336t-872ed1360c5591454b6d9889cbb57f1d41606a3c3e3f9bb09d7485d300e7e3113</originalsourceid><addsrcrecordid>eNqN0U1LAzEQBuAgCtYqePWWk3jo1szm25sUPwoFD-p5yWZnNdLu1s220H9v7IpXPQ1hnmQmvIScA5sCMHsNappDzvQBGYGUOrNKqEMyYgxMZrnhx-Qkxo90VELkI_I8b7YY-_Dm-tA2tK1p9K6pXI_Uu_69rTDeUFyFGFN7QmtXdsHv7YQmR53vw3a4u-5ajzFiPCVHtVtGPPupY_J6f_cye8wWTw_z2e0i85yrPjM6xwq4Yl5KC0KKUlXWGOvLUuoaKgGKKcc9R17bsmS20sLIijOGGjkAH5PL4d00-XOTflGkPT0ul67BdhOL3AgrhDR_Q8mlYcD_BXWuVYJXA_RdG2OHdbHuwsp1uwJY8Z1DAarY55DoxUADIv6yofcFf8KBjg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25357276</pqid></control><display><type>article</type><title>Investigation of scandate cathodes: emission, fabrication, and activation processes</title><source>IEEE Electronic Library (IEL)</source><creator>Gibson, J.W. ; Haas, G.A. ; Thomas, R.E.</creator><creatorcontrib>Gibson, J.W. ; Haas, G.A. ; Thomas, R.E.</creatorcontrib><description>Top-layer cathodes have been shown to exhibit work function values in the 1.5-eV range near 1100 K. Emission from cathodes made by sputter deposition of a Sc/sub 2/O/sub 3//W layer on top of an impregnated cathode were limited by the deposition conditions that cause dissociation of Sc/sub 2/O/sub 3/ and/or formation of volatile oxides of W. Pure Sc/sub 2/O/sub 3/ layers were also activated by an external Ba source to the value of the work function reported above. These results and activation mechanisms and characteristics that are peculiar to the Ba-O-Sc surface are discussed.&lt; &gt;</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/16.21207</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>IEEE</publisher><subject>Cathodes ; Extrapolation ; Fabrication ; Geometry ; Laboratories ; Plugs ; Sputtering ; Temperature ; Testing ; Thermionic emission</subject><ispartof>IEEE transactions on electron devices, 1989-01, Vol.36 (1), p.209-214</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c336t-872ed1360c5591454b6d9889cbb57f1d41606a3c3e3f9bb09d7485d300e7e3113</citedby><cites>FETCH-LOGICAL-c336t-872ed1360c5591454b6d9889cbb57f1d41606a3c3e3f9bb09d7485d300e7e3113</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/21207$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/21207$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gibson, J.W.</creatorcontrib><creatorcontrib>Haas, G.A.</creatorcontrib><creatorcontrib>Thomas, R.E.</creatorcontrib><title>Investigation of scandate cathodes: emission, fabrication, and activation processes</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>Top-layer cathodes have been shown to exhibit work function values in the 1.5-eV range near 1100 K. Emission from cathodes made by sputter deposition of a Sc/sub 2/O/sub 3//W layer on top of an impregnated cathode were limited by the deposition conditions that cause dissociation of Sc/sub 2/O/sub 3/ and/or formation of volatile oxides of W. Pure Sc/sub 2/O/sub 3/ layers were also activated by an external Ba source to the value of the work function reported above. These results and activation mechanisms and characteristics that are peculiar to the Ba-O-Sc surface are discussed.&lt; &gt;</description><subject>Cathodes</subject><subject>Extrapolation</subject><subject>Fabrication</subject><subject>Geometry</subject><subject>Laboratories</subject><subject>Plugs</subject><subject>Sputtering</subject><subject>Temperature</subject><subject>Testing</subject><subject>Thermionic emission</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1989</creationdate><recordtype>article</recordtype><recordid>eNqN0U1LAzEQBuAgCtYqePWWk3jo1szm25sUPwoFD-p5yWZnNdLu1s220H9v7IpXPQ1hnmQmvIScA5sCMHsNappDzvQBGYGUOrNKqEMyYgxMZrnhx-Qkxo90VELkI_I8b7YY-_Dm-tA2tK1p9K6pXI_Uu_69rTDeUFyFGFN7QmtXdsHv7YQmR53vw3a4u-5ajzFiPCVHtVtGPPupY_J6f_cye8wWTw_z2e0i85yrPjM6xwq4Yl5KC0KKUlXWGOvLUuoaKgGKKcc9R17bsmS20sLIijOGGjkAH5PL4d00-XOTflGkPT0ul67BdhOL3AgrhDR_Q8mlYcD_BXWuVYJXA_RdG2OHdbHuwsp1uwJY8Z1DAarY55DoxUADIv6yofcFf8KBjg</recordid><startdate>198901</startdate><enddate>198901</enddate><creator>Gibson, J.W.</creator><creator>Haas, G.A.</creator><creator>Thomas, R.E.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope></search><sort><creationdate>198901</creationdate><title>Investigation of scandate cathodes: emission, fabrication, and activation processes</title><author>Gibson, J.W. ; Haas, G.A. ; Thomas, R.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c336t-872ed1360c5591454b6d9889cbb57f1d41606a3c3e3f9bb09d7485d300e7e3113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1989</creationdate><topic>Cathodes</topic><topic>Extrapolation</topic><topic>Fabrication</topic><topic>Geometry</topic><topic>Laboratories</topic><topic>Plugs</topic><topic>Sputtering</topic><topic>Temperature</topic><topic>Testing</topic><topic>Thermionic emission</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gibson, J.W.</creatorcontrib><creatorcontrib>Haas, G.A.</creatorcontrib><creatorcontrib>Thomas, R.E.</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gibson, J.W.</au><au>Haas, G.A.</au><au>Thomas, R.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of scandate cathodes: emission, fabrication, and activation processes</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1989-01</date><risdate>1989</risdate><volume>36</volume><issue>1</issue><spage>209</spage><epage>214</epage><pages>209-214</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>Top-layer cathodes have been shown to exhibit work function values in the 1.5-eV range near 1100 K. Emission from cathodes made by sputter deposition of a Sc/sub 2/O/sub 3//W layer on top of an impregnated cathode were limited by the deposition conditions that cause dissociation of Sc/sub 2/O/sub 3/ and/or formation of volatile oxides of W. Pure Sc/sub 2/O/sub 3/ layers were also activated by an external Ba source to the value of the work function reported above. These results and activation mechanisms and characteristics that are peculiar to the Ba-O-Sc surface are discussed.&lt; &gt;</abstract><pub>IEEE</pub><doi>10.1109/16.21207</doi><tpages>6</tpages></addata></record>
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subjects Cathodes
Extrapolation
Fabrication
Geometry
Laboratories
Plugs
Sputtering
Temperature
Testing
Thermionic emission
title Investigation of scandate cathodes: emission, fabrication, and activation processes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T17%3A26%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20of%20scandate%20cathodes:%20emission,%20fabrication,%20and%20activation%20processes&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Gibson,%20J.W.&rft.date=1989-01&rft.volume=36&rft.issue=1&rft.spage=209&rft.epage=214&rft.pages=209-214&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/16.21207&rft_dat=%3Cproquest_RIE%3E25357276%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25357276&rft_id=info:pmid/&rft_ieee_id=21207&rfr_iscdi=true