The PCB circuit analysis system based on AI

A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. Th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Han, K., Watson, K.L.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 403
container_issue
container_start_page 399
container_title
container_volume
creator Han, K.
Watson, K.L.
description A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.< >
doi_str_mv 10.1109/AUTEST.1991.197583
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_197583</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>197583</ieee_id><sourcerecordid>197583</sourcerecordid><originalsourceid>FETCH-LOGICAL-i104t-b46f9e859ba9b0e81b9b8b90577076ae97469eb3b9a1f8f744ebdf08b61a7f2a3</originalsourceid><addsrcrecordid>eNotj8tKA0EQRRtEUGN-IKvey8SuTL9qOQ5RAwEFJ-tQlVRjSxJlelzM3xuId3HO7sBVagZmDmDwsdl0y49uDohwRnCxvlJ3Jga0Cxd8vFHTUr7MedaB93CrHrpP0e_tk97lfvebB00nOowlF13GMshRMxXZ6--Tblb36jrRocj03xO1eV527Wu1fntZtc26ymDsULH1CSU6ZEI2EoGRI6NxIZjgSTBYj8I1I0GKKVgrvE8msgcKaUH1RM0u3Swi258-H6kft5c79R_oxz-U</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>The PCB circuit analysis system based on AI</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Han, K. ; Watson, K.L.</creator><creatorcontrib>Han, K. ; Watson, K.L.</creatorcontrib><description>A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.&lt; &gt;</description><identifier>ISBN: 0879425768</identifier><identifier>ISBN: 9780879425760</identifier><identifier>DOI: 10.1109/AUTEST.1991.197583</identifier><language>eng</language><publisher>IEEE</publisher><subject>Artificial intelligence ; Circuit analysis ; Circuit faults ; Circuit testing ; Electronic equipment manufacture ; Expert systems ; Printed circuits ; Statistical analysis ; System testing</subject><ispartof>Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s, 1991, p.399-403</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/197583$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/197583$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Han, K.</creatorcontrib><creatorcontrib>Watson, K.L.</creatorcontrib><title>The PCB circuit analysis system based on AI</title><title>Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s</title><addtitle>AUTEST</addtitle><description>A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.&lt; &gt;</description><subject>Artificial intelligence</subject><subject>Circuit analysis</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Electronic equipment manufacture</subject><subject>Expert systems</subject><subject>Printed circuits</subject><subject>Statistical analysis</subject><subject>System testing</subject><isbn>0879425768</isbn><isbn>9780879425760</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1991</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKA0EQRRtEUGN-IKvey8SuTL9qOQ5RAwEFJ-tQlVRjSxJlelzM3xuId3HO7sBVagZmDmDwsdl0y49uDohwRnCxvlJ3Jga0Cxd8vFHTUr7MedaB93CrHrpP0e_tk97lfvebB00nOowlF13GMshRMxXZ6--Tblb36jrRocj03xO1eV527Wu1fntZtc26ymDsULH1CSU6ZEI2EoGRI6NxIZjgSTBYj8I1I0GKKVgrvE8msgcKaUH1RM0u3Swi258-H6kft5c79R_oxz-U</recordid><startdate>1991</startdate><enddate>1991</enddate><creator>Han, K.</creator><creator>Watson, K.L.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1991</creationdate><title>The PCB circuit analysis system based on AI</title><author>Han, K. ; Watson, K.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-b46f9e859ba9b0e81b9b8b90577076ae97469eb3b9a1f8f744ebdf08b61a7f2a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Artificial intelligence</topic><topic>Circuit analysis</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Electronic equipment manufacture</topic><topic>Expert systems</topic><topic>Printed circuits</topic><topic>Statistical analysis</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Han, K.</creatorcontrib><creatorcontrib>Watson, K.L.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Han, K.</au><au>Watson, K.L.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The PCB circuit analysis system based on AI</atitle><btitle>Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s</btitle><stitle>AUTEST</stitle><date>1991</date><risdate>1991</risdate><spage>399</spage><epage>403</epage><pages>399-403</pages><isbn>0879425768</isbn><isbn>9780879425760</isbn><abstract>A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.&lt; &gt;</abstract><pub>IEEE</pub><doi>10.1109/AUTEST.1991.197583</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 0879425768
ispartof Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s, 1991, p.399-403
issn
language eng
recordid cdi_ieee_primary_197583
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Artificial intelligence
Circuit analysis
Circuit faults
Circuit testing
Electronic equipment manufacture
Expert systems
Printed circuits
Statistical analysis
System testing
title The PCB circuit analysis system based on AI
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T18%3A13%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=The%20PCB%20circuit%20analysis%20system%20based%20on%20AI&rft.btitle=Conference%20Record%20AUTOTESTCON%20'91%20IEEE%20Systems%20Readiness%20Technology%20Conference%20Improving%20Systems%20Effectiveness%20in%20the%20Changing%20Environment%20of%20the%20'90s&rft.au=Han,%20K.&rft.date=1991&rft.spage=399&rft.epage=403&rft.pages=399-403&rft.isbn=0879425768&rft.isbn_list=9780879425760&rft_id=info:doi/10.1109/AUTEST.1991.197583&rft_dat=%3Cieee_6IE%3E197583%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=197583&rfr_iscdi=true