The PCB circuit analysis system based on AI
A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. Th...
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creator | Han, K. Watson, K.L. |
description | A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.< > |
doi_str_mv | 10.1109/AUTEST.1991.197583 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_197583</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>197583</ieee_id><sourcerecordid>197583</sourcerecordid><originalsourceid>FETCH-LOGICAL-i104t-b46f9e859ba9b0e81b9b8b90577076ae97469eb3b9a1f8f744ebdf08b61a7f2a3</originalsourceid><addsrcrecordid>eNotj8tKA0EQRRtEUGN-IKvey8SuTL9qOQ5RAwEFJ-tQlVRjSxJlelzM3xuId3HO7sBVagZmDmDwsdl0y49uDohwRnCxvlJ3Jga0Cxd8vFHTUr7MedaB93CrHrpP0e_tk97lfvebB00nOowlF13GMshRMxXZ6--Tblb36jrRocj03xO1eV527Wu1fntZtc26ymDsULH1CSU6ZEI2EoGRI6NxIZjgSTBYj8I1I0GKKVgrvE8msgcKaUH1RM0u3Swi258-H6kft5c79R_oxz-U</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>The PCB circuit analysis system based on AI</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Han, K. ; Watson, K.L.</creator><creatorcontrib>Han, K. ; Watson, K.L.</creatorcontrib><description>A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.< ></description><identifier>ISBN: 0879425768</identifier><identifier>ISBN: 9780879425760</identifier><identifier>DOI: 10.1109/AUTEST.1991.197583</identifier><language>eng</language><publisher>IEEE</publisher><subject>Artificial intelligence ; Circuit analysis ; Circuit faults ; Circuit testing ; Electronic equipment manufacture ; Expert systems ; Printed circuits ; Statistical analysis ; System testing</subject><ispartof>Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s, 1991, p.399-403</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/197583$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/197583$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Han, K.</creatorcontrib><creatorcontrib>Watson, K.L.</creatorcontrib><title>The PCB circuit analysis system based on AI</title><title>Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s</title><addtitle>AUTEST</addtitle><description>A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.< ></description><subject>Artificial intelligence</subject><subject>Circuit analysis</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Electronic equipment manufacture</subject><subject>Expert systems</subject><subject>Printed circuits</subject><subject>Statistical analysis</subject><subject>System testing</subject><isbn>0879425768</isbn><isbn>9780879425760</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1991</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKA0EQRRtEUGN-IKvey8SuTL9qOQ5RAwEFJ-tQlVRjSxJlelzM3xuId3HO7sBVagZmDmDwsdl0y49uDohwRnCxvlJ3Jga0Cxd8vFHTUr7MedaB93CrHrpP0e_tk97lfvebB00nOowlF13GMshRMxXZ6--Tblb36jrRocj03xO1eV527Wu1fntZtc26ymDsULH1CSU6ZEI2EoGRI6NxIZjgSTBYj8I1I0GKKVgrvE8msgcKaUH1RM0u3Swi258-H6kft5c79R_oxz-U</recordid><startdate>1991</startdate><enddate>1991</enddate><creator>Han, K.</creator><creator>Watson, K.L.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1991</creationdate><title>The PCB circuit analysis system based on AI</title><author>Han, K. ; Watson, K.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-b46f9e859ba9b0e81b9b8b90577076ae97469eb3b9a1f8f744ebdf08b61a7f2a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Artificial intelligence</topic><topic>Circuit analysis</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Electronic equipment manufacture</topic><topic>Expert systems</topic><topic>Printed circuits</topic><topic>Statistical analysis</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Han, K.</creatorcontrib><creatorcontrib>Watson, K.L.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Han, K.</au><au>Watson, K.L.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The PCB circuit analysis system based on AI</atitle><btitle>Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s</btitle><stitle>AUTEST</stitle><date>1991</date><risdate>1991</risdate><spage>399</spage><epage>403</epage><pages>399-403</pages><isbn>0879425768</isbn><isbn>9780879425760</isbn><abstract>A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.< ></abstract><pub>IEEE</pub><doi>10.1109/AUTEST.1991.197583</doi><tpages>5</tpages></addata></record> |
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identifier | ISBN: 0879425768 |
ispartof | Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s, 1991, p.399-403 |
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language | eng |
recordid | cdi_ieee_primary_197583 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Artificial intelligence Circuit analysis Circuit faults Circuit testing Electronic equipment manufacture Expert systems Printed circuits Statistical analysis System testing |
title | The PCB circuit analysis system based on AI |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T18%3A13%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=The%20PCB%20circuit%20analysis%20system%20based%20on%20AI&rft.btitle=Conference%20Record%20AUTOTESTCON%20'91%20IEEE%20Systems%20Readiness%20Technology%20Conference%20Improving%20Systems%20Effectiveness%20in%20the%20Changing%20Environment%20of%20the%20'90s&rft.au=Han,%20K.&rft.date=1991&rft.spage=399&rft.epage=403&rft.pages=399-403&rft.isbn=0879425768&rft.isbn_list=9780879425760&rft_id=info:doi/10.1109/AUTEST.1991.197583&rft_dat=%3Cieee_6IE%3E197583%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=197583&rfr_iscdi=true |