Analysis of tunneling magnetic force microscopy using a flexible triangular probe
The authors have performed a theoretical analysis of the interaction between a flexible triangular probe and a typical magnetic pattern on a recorded surface. The use of this analysis allows the measurement of the magnetic fields of the recorded patterns imaged by a tunneling magnetic force microsco...
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Veröffentlicht in: | IEEE transactions on magnetics 1992-09, Vol.28 (5), p.3135-3137 |
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container_title | IEEE transactions on magnetics |
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creator | Burke, E.R. Gomez, R.D. Adly, A.A. Mayergoyz, I.D. |
description | The authors have performed a theoretical analysis of the interaction between a flexible triangular probe and a typical magnetic pattern on a recorded surface. The use of this analysis allows the measurement of the magnetic fields of the recorded patterns imaged by a tunneling magnetic force microscope. It is also shown how the sensitivity of the microscope varies with the orientation of the probe, and how this relates to experimental data.< > |
doi_str_mv | 10.1109/20.179736 |
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The use of this analysis allows the measurement of the magnetic fields of the recorded patterns imaged by a tunneling magnetic force microscope. 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issn | 0018-9464 1941-0069 |
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source | IEEE Electronic Library (IEL) |
subjects | Exact sciences and technology Force measurement Image analysis Instruments, apparatus, components and techniques common to several branches of physics and astronomy Magnetic analysis Magnetic components, instruments and techniques Magnetic field measurement Magnetic force microscopy Magnetic forces Magnetic tunneling Pattern analysis Performance analysis Physics Probes |
title | Analysis of tunneling magnetic force microscopy using a flexible triangular probe |
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