On Fault Isolation and Identification in t1/t1-Diagnosable Systems
Consider a classical PMC system composed of n units [1] where it is assumed that at most t1 of these units are faulty. Such a system is said to be t1/t1-diagnosable [3] if, given any complete collection of test results, the set of faulty units can be isolated to within a set of at most t1 units. Thi...
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| Veröffentlicht in: | IEEE transactions on computers 1986-07, Vol.C-35 (7), p.639-643 |
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| container_title | IEEE transactions on computers |
| container_volume | C-35 |
| creator | CHE-LIANG YANG MASSON, G. M LEONETTI, E. A |
| description | Consider a classical PMC system composed of n units [1] where it is assumed that at most t1 of these units are faulty. Such a system is said to be t1/t1-diagnosable [3] if, given any complete collection of test results, the set of faulty units can be isolated to within a set of at most t1 units. This paper exposes some new, important properties of general t1/t1-diagnosable systems to present an O(n2.5) algorithm by which all the faulty units except at most one can be correctly identified and all the faulty units can be isolated to within a set of t1 or fewer units in which at most one can possibly be fault free. |
| doi_str_mv | 10.1109/TC.1986.1676805 |
| format | Article |
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| ispartof | IEEE transactions on computers, 1986-07, Vol.C-35 (7), p.639-643 |
| issn | 0018-9340 1557-9956 |
| language | eng |
| recordid | cdi_ieee_primary_1676805 |
| source | IEEE Electronic Library (IEL) |
| subjects | Allowable fault sets Applied sciences Electronics Exact sciences and technology fault diagnosis fault isolation Hardware PMC models Reliability syndrome test assignment vertex cover sets |
| title | On Fault Isolation and Identification in t1/t1-Diagnosable Systems |
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