Tam Opti̇k Anahtarlama İçi̇n Faz Anali̇zi̇

In this work we investigate an all-optical switching node that can be controlled by means of a transient grating, which is formed by interference of two Gaussian beams. This design considers phase effect in the reflection of light from transient grating, real profile of Gaussian beams and fast switc...

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Hauptverfasser: Dinleyici, M.S., Akin, O.
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description In this work we investigate an all-optical switching node that can be controlled by means of a transient grating, which is formed by interference of two Gaussian beams. This design considers phase effect in the reflection of light from transient grating, real profile of Gaussian beams and fast switching time requirements. Four wave mixing (FWM) technique is applied in the evanescent field region of waveguide, showing chi (3) nonlinearity. The formed grating is analysed by standard methods to obtain the phase of diffracted light and reflection coefficients to find the power exchange between reflection orders
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Gaussian processes
Germanium silicon alloys
Photorefractive effect
Silicon germanium
title Tam Opti̇k Anahtarlama İçi̇n Faz Anali̇zi̇
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