Characteristics of Hebbian-type associative memories having faulty interconnections

The performance of Hebbian-type associative memories (HAMs) in the presence of faulty (open- and short-circuit) synaptic interconnections is examined and equations for predicting network reliability are developed. The results show that a network with open-circuit interconnection faults has a higher...

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Veröffentlicht in:	IEEE transactions on neural networks 1992-11, Vol.3 (6), p.969-980
Hauptverfasser:	Chung, P.-C., Krile, T.F.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Associative memory Circuit faults Convergence Electric, optical and optoelectronic circuits Electronics Error correction Exact sciences and technology Integrated circuit interconnections Neural networks Neurons Optical interconnections Optical modulation Optical sensors Probes
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