Swept Wavelenght Optical Six-Port Measurement System
In this paper we show that the six-port measurement technique developed for metrology applications at microwave frequencies, can be extended up to optical frequencies by means of a designed six-port planar lightwave circuit (PLC). Simulation results of an optical swept wavelength six-port reflectome...
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creator | Molina-Fernandez, I. Perez-Lara, P. Wanguemert-Perez, J.G. |
description | In this paper we show that the six-port measurement technique developed for metrology applications at microwave frequencies, can be extended up to optical frequencies by means of a designed six-port planar lightwave circuit (PLC). Simulation results of an optical swept wavelength six-port reflectometer show that excellent results can be obtained with such a system for fiber Bragg grating (FBG) characterization |
doi_str_mv | 10.1109/MELCON.2006.1653112 |
format | Conference Proceeding |
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Simulation results of an optical swept wavelength six-port reflectometer show that excellent results can be obtained with such a system for fiber Bragg grating (FBG) characterization</description><identifier>ISSN: 2158-8473</identifier><identifier>ISBN: 9781424400874</identifier><identifier>ISBN: 1424400872</identifier><identifier>EISSN: 2158-8481</identifier><identifier>DOI: 10.1109/MELCON.2006.1653112</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit simulation ; Fiber gratings ; Measurement techniques ; Metrology ; Microwave circuits ; Microwave frequencies ; Optical design ; Optical design techniques ; Programmable control ; Wavelength measurement</subject><ispartof>MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference, 2006, p.356-359</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1653112$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1653112$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Molina-Fernandez, I.</creatorcontrib><creatorcontrib>Perez-Lara, P.</creatorcontrib><creatorcontrib>Wanguemert-Perez, J.G.</creatorcontrib><title>Swept Wavelenght Optical Six-Port Measurement System</title><title>MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference</title><addtitle>MELCON</addtitle><description>In this paper we show that the six-port measurement technique developed for metrology applications at microwave frequencies, can be extended up to optical frequencies by means of a designed six-port planar lightwave circuit (PLC). 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Simulation results of an optical swept wavelength six-port reflectometer show that excellent results can be obtained with such a system for fiber Bragg grating (FBG) characterization</abstract><pub>IEEE</pub><doi>10.1109/MELCON.2006.1653112</doi><tpages>4</tpages></addata></record> |
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identifier | ISSN: 2158-8473 |
ispartof | MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference, 2006, p.356-359 |
issn | 2158-8473 2158-8481 |
language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit simulation Fiber gratings Measurement techniques Metrology Microwave circuits Microwave frequencies Optical design Optical design techniques Programmable control Wavelength measurement |
title | Swept Wavelenght Optical Six-Port Measurement System |
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