Reverse noise measurement and use in device characterization

We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check measurement results, to significantly reduce the un...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Randa, J., McKay, T., Sweeney, S.L., Walker, D.K., Wagner, L., Greenberg, D.R., Tao, J., Ali Rezvani, G.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Active noise reduction Circuit noise NIST Noise measurement Optimized production technology Radio frequency Research and development Semiconductor device modeling Semiconductor device noise Time measurement
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