High resolution time domain and frequency domain package characterization up to 65 GHz
We present a measurement setup for high resolution time domain and frequency domain package characterization. The measurement setup features a sub-mm spatial resolution, which enables accurate time domain measurements of actual small sized package types. We evaluate common calibration techniques and...
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creator | Engl, M. Schiller, K. Eurskens, W. Weigel, R. |
description | We present a measurement setup for high resolution time domain and frequency domain package characterization. The measurement setup features a sub-mm spatial resolution, which enables accurate time domain measurements of actual small sized package types. We evaluate common calibration techniques and their suitability for package characterization in order to get most accurate measurement results. Further, we demonstrate the versatile utilization of time domain measurement techniques. Accurate impedance characterization and fault analysis of packages is achieved. In addition, we show frequency domain characterization of packages up to 65 GHz |
doi_str_mv | 10.1109/ECTC.2006.1645817 |
format | Conference Proceeding |
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The measurement setup features a sub-mm spatial resolution, which enables accurate time domain measurements of actual small sized package types. We evaluate common calibration techniques and their suitability for package characterization in order to get most accurate measurement results. Further, we demonstrate the versatile utilization of time domain measurement techniques. Accurate impedance characterization and fault analysis of packages is achieved. In addition, we show frequency domain characterization of packages up to 65 GHz</description><subject>Calibration</subject><subject>Coaxial components</subject><subject>Frequency domain analysis</subject><subject>Impedance</subject><subject>Instruments</subject><subject>Packaging</subject><subject>Reflection</subject><subject>Spatial resolution</subject><subject>Time measurement</subject><subject>Voltage</subject><issn>0569-5503</issn><issn>2377-5726</issn><isbn>1424401526</isbn><isbn>9781424401529</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kEtPwkAUhSc-EhH5AcbN_IHincedmS5Ng2BC4gbdktv2FkahxT4W8Os1iquTnOQ7-XKEuFcwVQrSx1m2yqYawE2VsxiUvxAjbbxP0Gt3KW6V1daCQu2uxAjQpQkimBsx6boPAFCpCy6EkXhfxM1Wttw1u6GPTS37uGdZNnuKtaS6lFXLXwPXxfG_PFDxSRuWxZZaKnpu44l-yeEg-0Y6lPPF6U5cV7TreHLOsXh7nq2yRbJ8nb9kT8skKo994sgZtBS0yXWoSuDUg8_BWMJcV8pi-WPNHnLklApCZR2GlEtjrDWVN2YsHv52IzOvD23cU3tcny8x33ydUkM</recordid><startdate>2006</startdate><enddate>2006</enddate><creator>Engl, M.</creator><creator>Schiller, K.</creator><creator>Eurskens, W.</creator><creator>Weigel, R.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2006</creationdate><title>High resolution time domain and frequency domain package characterization up to 65 GHz</title><author>Engl, M. ; Schiller, K. ; Eurskens, W. ; Weigel, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-6a6354a823b28fd0e9707b034a5b2f145d550e70b5e9aca5146589ed33443f733</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Calibration</topic><topic>Coaxial components</topic><topic>Frequency domain analysis</topic><topic>Impedance</topic><topic>Instruments</topic><topic>Packaging</topic><topic>Reflection</topic><topic>Spatial resolution</topic><topic>Time measurement</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Engl, M.</creatorcontrib><creatorcontrib>Schiller, K.</creatorcontrib><creatorcontrib>Eurskens, W.</creatorcontrib><creatorcontrib>Weigel, R.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Engl, M.</au><au>Schiller, K.</au><au>Eurskens, W.</au><au>Weigel, R.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>High resolution time domain and frequency domain package characterization up to 65 GHz</atitle><btitle>56th Electronic Components and Technology Conference 2006</btitle><stitle>ECTC</stitle><date>2006</date><risdate>2006</risdate><spage>7 pp.</spage><pages>7 pp.-</pages><issn>0569-5503</issn><eissn>2377-5726</eissn><isbn>1424401526</isbn><isbn>9781424401529</isbn><abstract>We present a measurement setup for high resolution time domain and frequency domain package characterization. The measurement setup features a sub-mm spatial resolution, which enables accurate time domain measurements of actual small sized package types. We evaluate common calibration techniques and their suitability for package characterization in order to get most accurate measurement results. Further, we demonstrate the versatile utilization of time domain measurement techniques. Accurate impedance characterization and fault analysis of packages is achieved. In addition, we show frequency domain characterization of packages up to 65 GHz</abstract><pub>IEEE</pub><doi>10.1109/ECTC.2006.1645817</doi></addata></record> |
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ispartof | 56th Electronic Components and Technology Conference 2006, 2006, p.7 pp. |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Calibration Coaxial components Frequency domain analysis Impedance Instruments Packaging Reflection Spatial resolution Time measurement Voltage |
title | High resolution time domain and frequency domain package characterization up to 65 GHz |
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