Semi-Algorithmic Test Pattern Generation

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Hauptverfasser:	Shahhoseini, H.S., Kazerouni, B.H.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithm design and analysis Circuit faults Circuit simulation Circuit testing Digital circuits Flow graphs Logic testing Reliability engineering Software testing Test pattern generators
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creator	Shahhoseini, H.S. Kazerouni, B.H.
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doi_str_mv	10.1109/AICCSA.2006.205126
format	Conference Proceeding
fullrecord	<record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1618391</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1618391</ieee_id><sourcerecordid>1618391</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-1779a005845368b54fb3960640b8ba839b136fce9b12368b56901d881e65c35c3</originalsourceid><addsrcrecordid>eNo9T01Lw0AQXfwAS5s_oJccvaTO7Oxudo8haC0ULLSeyyZOdKVJJdmL_95Fi8Pw3mHeByPELcISEdxDta7rXbWUACaBRmkuxEyiwUITwaXIXGlRSaVAItLV_03KG5FN0yekIUeW3Ezc77gPRXV8P40hfvShzfc8xXzrY-RxyFc88OhjOA0Lcd3548TZmefi9elxXz8Xm5fVuq42RcBSxwLL0nkAbZUmYxutuoacAaOgsY1PlQ2S6VpOLH8FxgG-WYtsdEtp5-LuLzcw8-FrDL0fvw_pgeRF-gFLW0HE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Semi-Algorithmic Test Pattern Generation</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Shahhoseini, H.S. ; Kazerouni, B.H.</creator><creatorcontrib>Shahhoseini, H.S. ; Kazerouni, B.H.</creatorcontrib><identifier>ISSN: 2161-5322</identifier><identifier>ISBN: 9781424402113</identifier><identifier>ISBN: 1424402115</identifier><identifier>EISSN: 2161-5330</identifier><identifier>DOI: 10.1109/AICCSA.2006.205126</identifier><language>eng</language><publisher>IEEE</publisher><subject>Algorithm design and analysis ; Circuit faults ; Circuit simulation ; Circuit testing ; Digital circuits ; Flow graphs ; Logic testing ; Reliability engineering ; Software testing ; Test pattern generators</subject><ispartof>IEEE International Conference on Computer Systems and Applications, 2006, 2006, p.429-432</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1618391$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1618391$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Shahhoseini, H.S.</creatorcontrib><creatorcontrib>Kazerouni, B.H.</creatorcontrib><title>Semi-Algorithmic Test Pattern Generation</title><title>IEEE International Conference on Computer Systems and Applications, 2006</title><addtitle>AICCSA</addtitle><subject>Algorithm design and analysis</subject><subject>Circuit faults</subject><subject>Circuit simulation</subject><subject>Circuit testing</subject><subject>Digital circuits</subject><subject>Flow graphs</subject><subject>Logic testing</subject><subject>Reliability engineering</subject><subject>Software testing</subject><subject>Test pattern generators</subject><issn>2161-5322</issn><issn>2161-5330</issn><isbn>9781424402113</isbn><isbn>1424402115</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9T01Lw0AQXfwAS5s_oJccvaTO7Oxudo8haC0ULLSeyyZOdKVJJdmL_95Fi8Pw3mHeByPELcISEdxDta7rXbWUACaBRmkuxEyiwUITwaXIXGlRSaVAItLV_03KG5FN0yekIUeW3Ezc77gPRXV8P40hfvShzfc8xXzrY-RxyFc88OhjOA0Lcd3548TZmefi9elxXz8Xm5fVuq42RcBSxwLL0nkAbZUmYxutuoacAaOgsY1PlQ2S6VpOLH8FxgG-WYtsdEtp5-LuLzcw8-FrDL0fvw_pgeRF-gFLW0HE</recordid><startdate>2006</startdate><enddate>2006</enddate><creator>Shahhoseini, H.S.</creator><creator>Kazerouni, B.H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2006</creationdate><title>Semi-Algorithmic Test Pattern Generation</title><author>Shahhoseini, H.S. ; Kazerouni, B.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-1779a005845368b54fb3960640b8ba839b136fce9b12368b56901d881e65c35c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Algorithm design and analysis</topic><topic>Circuit faults</topic><topic>Circuit simulation</topic><topic>Circuit testing</topic><topic>Digital circuits</topic><topic>Flow graphs</topic><topic>Logic testing</topic><topic>Reliability engineering</topic><topic>Software testing</topic><topic>Test pattern generators</topic><toplevel>online_resources</toplevel><creatorcontrib>Shahhoseini, H.S.</creatorcontrib><creatorcontrib>Kazerouni, B.H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shahhoseini, H.S.</au><au>Kazerouni, B.H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Semi-Algorithmic Test Pattern Generation</atitle><btitle>IEEE International Conference on Computer Systems and Applications, 2006</btitle><stitle>AICCSA</stitle><date>2006</date><risdate>2006</risdate><spage>429</spage><epage>432</epage><pages>429-432</pages><issn>2161-5322</issn><eissn>2161-5330</eissn><isbn>9781424402113</isbn><isbn>1424402115</isbn><pub>IEEE</pub><doi>10.1109/AICCSA.2006.205126</doi><tpages>4</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISSN: 2161-5322
ispartof	IEEE International Conference on Computer Systems and Applications, 2006, 2006, p.429-432
issn	2161-5322 2161-5330
language	eng
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Algorithm design and analysis Circuit faults Circuit simulation Circuit testing Digital circuits Flow graphs Logic testing Reliability engineering Software testing Test pattern generators
title	Semi-Algorithmic Test Pattern Generation
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T10%3A11%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Semi-Algorithmic%20Test%20Pattern%20Generation&rft.btitle=IEEE%20International%20Conference%20on%20Computer%20Systems%20and%20Applications,%202006&rft.au=Shahhoseini,%20H.S.&rft.date=2006&rft.spage=429&rft.epage=432&rft.pages=429-432&rft.issn=2161-5322&rft.eissn=2161-5330&rft.isbn=9781424402113&rft.isbn_list=1424402115&rft_id=info:doi/10.1109/AICCSA.2006.205126&rft_dat=%3Cieee_6IE%3E1618391%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1618391&rfr_iscdi=true