Ring oscillator based technique for measuring variability statistics

Device parameter induced frequency variations in a dense array of nominally identical ring oscillators are measured by sequentially combining the output frequencies into a single frequency modulated signal with the statistical frequency parameters read out by a standard frequency counter. For the ex...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Bhushan, M., Ketchen, M.B., Polonsky, S., Gattiker, A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Counting circuits Data analysis Decoding Delay Frequency MOSFET circuits Ring oscillators Statistics Switching circuits
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