Ring oscillator based technique for measuring variability statistics
Device parameter induced frequency variations in a dense array of nominally identical ring oscillators are measured by sequentially combining the output frequencies into a single frequency modulated signal with the statistical frequency parameters read out by a standard frequency counter. For the ex...
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| creator | Bhushan, M. Ketchen, M.B. Polonsky, S. Gattiker, A. |
| description | Device parameter induced frequency variations in a dense array of nominally identical ring oscillators are measured by sequentially combining the output frequencies into a single frequency modulated signal with the statistical frequency parameters read out by a standard frequency counter. For the example described here, the ring oscillators are designed to capture random variations in MOSFET threshold voltages. |
| doi_str_mv | 10.1109/ICMTS.2006.1614281 |
| format | Conference Proceeding |
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For the example described here, the ring oscillators are designed to capture random variations in MOSFET threshold voltages.</abstract><pub>IEEE</pub><doi>10.1109/ICMTS.2006.1614281</doi><tpages>6</tpages></addata></record> |
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| identifier | ISSN: 1071-9032 |
| ispartof | 2006 IEEE International Conference on Microelectronic Test Structures, 2006, p.87-92 |
| issn | 1071-9032 2158-1029 |
| language | eng |
| recordid | cdi_ieee_primary_1614281 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing Counting circuits Data analysis Decoding Delay Frequency MOSFET circuits Ring oscillators Statistics Switching circuits |
| title | Ring oscillator based technique for measuring variability statistics |
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