Detectors for the X-ray testing systems
The gallium arsenide detectors working in photovaultarical mode on epitaxial films compensated by chromium are developed. It is shown that in such detectors it is possible to essentially increase the efficiency of charge collection at inclined position of the detector relatively X-rays. The image wi...
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| creator | Ayzenshtat, G.I. Vilisova, M.D. Lelekov, M.A. Ivashchenko, A.I. Mokeev, D.Yu Porokhovnichenko, L.P. Tolbanov, O.P. Shapoval, L.G. |
| description | The gallium arsenide detectors working in photovaultarical mode on epitaxial films compensated by chromium are developed. It is shown that in such detectors it is possible to essentially increase the efficiency of charge collection at inclined position of the detector relatively X-rays. The image with resolution 5 lp/mm is received by created coordinate detectors. |
| doi_str_mv | 10.1109/SIBCON.2005.1611196 |
| format | Conference Proceeding |
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It is shown that in such detectors it is possible to essentially increase the efficiency of charge collection at inclined position of the detector relatively X-rays. 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It is shown that in such detectors it is possible to essentially increase the efficiency of charge collection at inclined position of the detector relatively X-rays. The image with resolution 5 lp/mm is received by created coordinate detectors.</description><subject>Chromium</subject><subject>Digital systems</subject><subject>GaAs-detector</subject><subject>Gallium arsenide</subject><subject>Gamma ray detection</subject><subject>Gamma ray detectors</subject><subject>Silicon</subject><subject>System testing</subject><subject>X-ray detection</subject><subject>X-Ray detector</subject><subject>X-ray detectors</subject><subject>X-ray imaging</subject><isbn>0780392191</isbn><isbn>9780780392199</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpjYJA2NNAzNDSw1A_2dHL299MzMjAw1TM0MzQ0tDRjZuAyMLcwMLY0MrQ05GDgLS7OMgACY0tjc1MLTgZ1l9SS1OSS_KJihbT8IoWSjFSFCN2ixEqFktTiksy8dIXiyuKS1NxiHgbWtMSc4lReKM3NIO3mGuLsoZuZmpoaX1CUmZtYVBkPtdMYvywAStMv9w</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Ayzenshtat, G.I.</creator><creator>Vilisova, M.D.</creator><creator>Lelekov, M.A.</creator><creator>Ivashchenko, A.I.</creator><creator>Mokeev, D.Yu</creator><creator>Porokhovnichenko, L.P.</creator><creator>Tolbanov, O.P.</creator><creator>Shapoval, L.G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2005</creationdate><title>Detectors for the X-ray testing systems</title><author>Ayzenshtat, G.I. ; Vilisova, M.D. ; Lelekov, M.A. ; Ivashchenko, A.I. ; Mokeev, D.Yu ; Porokhovnichenko, L.P. ; Tolbanov, O.P. ; Shapoval, L.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_16111963</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Chromium</topic><topic>Digital systems</topic><topic>GaAs-detector</topic><topic>Gallium arsenide</topic><topic>Gamma ray detection</topic><topic>Gamma ray detectors</topic><topic>Silicon</topic><topic>System testing</topic><topic>X-ray detection</topic><topic>X-Ray detector</topic><topic>X-ray detectors</topic><topic>X-ray imaging</topic><toplevel>online_resources</toplevel><creatorcontrib>Ayzenshtat, G.I.</creatorcontrib><creatorcontrib>Vilisova, M.D.</creatorcontrib><creatorcontrib>Lelekov, M.A.</creatorcontrib><creatorcontrib>Ivashchenko, A.I.</creatorcontrib><creatorcontrib>Mokeev, D.Yu</creatorcontrib><creatorcontrib>Porokhovnichenko, L.P.</creatorcontrib><creatorcontrib>Tolbanov, O.P.</creatorcontrib><creatorcontrib>Shapoval, L.G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ayzenshtat, G.I.</au><au>Vilisova, M.D.</au><au>Lelekov, M.A.</au><au>Ivashchenko, A.I.</au><au>Mokeev, D.Yu</au><au>Porokhovnichenko, L.P.</au><au>Tolbanov, O.P.</au><au>Shapoval, L.G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Detectors for the X-ray testing systems</atitle><btitle>2005 Siberian Conference on Control and Communications</btitle><stitle>SIBCON</stitle><date>2005</date><risdate>2005</risdate><spage>74</spage><epage>79</epage><pages>74-79</pages><isbn>0780392191</isbn><isbn>9780780392199</isbn><abstract>The gallium arsenide detectors working in photovaultarical mode on epitaxial films compensated by chromium are developed. It is shown that in such detectors it is possible to essentially increase the efficiency of charge collection at inclined position of the detector relatively X-rays. The image with resolution 5 lp/mm is received by created coordinate detectors.</abstract><pub>IEEE</pub><doi>10.1109/SIBCON.2005.1611196</doi></addata></record> |
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| identifier | ISBN: 0780392191 |
| ispartof | 2005 Siberian Conference on Control and Communications, 2005, p.74-79 |
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| language | eng |
| recordid | cdi_ieee_primary_1611196 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Chromium Digital systems GaAs-detector Gallium arsenide Gamma ray detection Gamma ray detectors Silicon System testing X-ray detection X-Ray detector X-ray detectors X-ray imaging |
| title | Detectors for the X-ray testing systems |
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