Model-based design for test vector verification
To meet the needs of a competitive marketplace, model-based design is increasingly being adopted by companies. The use of computational models throughout the system design process accelerates development and increases quality by executable specifications, broader and automatic exploration of the des...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 634 |
|---|---|
| container_issue | |
| container_start_page | 628 |
| container_title | |
| container_volume | |
| creator | Mosterman, P.J. Shenoy, R. Ghidella, J.R. Murphy, B. |
| description | To meet the needs of a competitive marketplace, model-based design is increasingly being adopted by companies. The use of computational models throughout the system design process accelerates development and increases quality by executable specifications, broader and automatic exploration of the design space, and high-level verification and validation. This paper shows how coverage technologies used in model-based design can be exploited in the verification and selection of test vectors used to troubleshoot faulty equipment |
| doi_str_mv | 10.1109/AUTEST.2005.1609209 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1609209</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1609209</ieee_id><sourcerecordid>1609209</sourcerecordid><originalsourceid>FETCH-LOGICAL-i220t-cf25188866adc2f119b6db943685b971a7a26d9b2f988939e52687e55d3d3d123</originalsourceid><addsrcrecordid>eNotT9tqAjEUDL1ArfULfNkfyHpO4snlUcTWgqUPXZ8luzkpKVbLZhH6912ozMAMDDMwQswRakTwi9W-2Xw0tQKgGg14Bf5GTJDIySUR3IqZtw5Gao-A9m7MwDlpraIH8VjKF8DYNTQRi7dz5KNsQ-FYRS7581Slc18NXIbqwt0w-gv3OeUuDPl8ehL3KRwLz646FfvnTbPeyt37y-t6tZNZKRhklxShc86YEDuVEH1rYuuX2jhqvcVggzLRtyp557z2TMo4y0RRj0Clp2L-v5uZ-fDT5-_Q_x6uX_UfwCRFFg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Model-based design for test vector verification</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Mosterman, P.J. ; Shenoy, R. ; Ghidella, J.R. ; Murphy, B.</creator><creatorcontrib>Mosterman, P.J. ; Shenoy, R. ; Ghidella, J.R. ; Murphy, B.</creatorcontrib><description>To meet the needs of a competitive marketplace, model-based design is increasingly being adopted by companies. The use of computational models throughout the system design process accelerates development and increases quality by executable specifications, broader and automatic exploration of the design space, and high-level verification and validation. This paper shows how coverage technologies used in model-based design can be exploited in the verification and selection of test vectors used to troubleshoot faulty equipment</description><identifier>ISSN: 1088-7725</identifier><identifier>ISBN: 9780780391017</identifier><identifier>ISBN: 0780391012</identifier><identifier>EISSN: 1558-4550</identifier><identifier>DOI: 10.1109/AUTEST.2005.1609209</identifier><language>eng</language><publisher>IEEE</publisher><subject>Acceleration ; Computational modeling ; Costs ; Design engineering ; Performance evaluation ; Physics computing ; Power system modeling ; Process design ; Space technology ; System testing</subject><ispartof>IEEE Autotestcon, 2005, 2005, p.628-634</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1609209$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4040,4041,27916,54911</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1609209$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mosterman, P.J.</creatorcontrib><creatorcontrib>Shenoy, R.</creatorcontrib><creatorcontrib>Ghidella, J.R.</creatorcontrib><creatorcontrib>Murphy, B.</creatorcontrib><title>Model-based design for test vector verification</title><title>IEEE Autotestcon, 2005</title><addtitle>AUTEST</addtitle><description>To meet the needs of a competitive marketplace, model-based design is increasingly being adopted by companies. The use of computational models throughout the system design process accelerates development and increases quality by executable specifications, broader and automatic exploration of the design space, and high-level verification and validation. This paper shows how coverage technologies used in model-based design can be exploited in the verification and selection of test vectors used to troubleshoot faulty equipment</description><subject>Acceleration</subject><subject>Computational modeling</subject><subject>Costs</subject><subject>Design engineering</subject><subject>Performance evaluation</subject><subject>Physics computing</subject><subject>Power system modeling</subject><subject>Process design</subject><subject>Space technology</subject><subject>System testing</subject><issn>1088-7725</issn><issn>1558-4550</issn><isbn>9780780391017</isbn><isbn>0780391012</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT9tqAjEUDL1ArfULfNkfyHpO4snlUcTWgqUPXZ8luzkpKVbLZhH6912ozMAMDDMwQswRakTwi9W-2Xw0tQKgGg14Bf5GTJDIySUR3IqZtw5Gao-A9m7MwDlpraIH8VjKF8DYNTQRi7dz5KNsQ-FYRS7581Slc18NXIbqwt0w-gv3OeUuDPl8ehL3KRwLz646FfvnTbPeyt37y-t6tZNZKRhklxShc86YEDuVEH1rYuuX2jhqvcVggzLRtyp557z2TMo4y0RRj0Clp2L-v5uZ-fDT5-_Q_x6uX_UfwCRFFg</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Mosterman, P.J.</creator><creator>Shenoy, R.</creator><creator>Ghidella, J.R.</creator><creator>Murphy, B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>Model-based design for test vector verification</title><author>Mosterman, P.J. ; Shenoy, R. ; Ghidella, J.R. ; Murphy, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i220t-cf25188866adc2f119b6db943685b971a7a26d9b2f988939e52687e55d3d3d123</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Acceleration</topic><topic>Computational modeling</topic><topic>Costs</topic><topic>Design engineering</topic><topic>Performance evaluation</topic><topic>Physics computing</topic><topic>Power system modeling</topic><topic>Process design</topic><topic>Space technology</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Mosterman, P.J.</creatorcontrib><creatorcontrib>Shenoy, R.</creatorcontrib><creatorcontrib>Ghidella, J.R.</creatorcontrib><creatorcontrib>Murphy, B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mosterman, P.J.</au><au>Shenoy, R.</au><au>Ghidella, J.R.</au><au>Murphy, B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Model-based design for test vector verification</atitle><btitle>IEEE Autotestcon, 2005</btitle><stitle>AUTEST</stitle><date>2005</date><risdate>2005</risdate><spage>628</spage><epage>634</epage><pages>628-634</pages><issn>1088-7725</issn><eissn>1558-4550</eissn><isbn>9780780391017</isbn><isbn>0780391012</isbn><abstract>To meet the needs of a competitive marketplace, model-based design is increasingly being adopted by companies. The use of computational models throughout the system design process accelerates development and increases quality by executable specifications, broader and automatic exploration of the design space, and high-level verification and validation. This paper shows how coverage technologies used in model-based design can be exploited in the verification and selection of test vectors used to troubleshoot faulty equipment</abstract><pub>IEEE</pub><doi>10.1109/AUTEST.2005.1609209</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1088-7725 |
| ispartof | IEEE Autotestcon, 2005, 2005, p.628-634 |
| issn | 1088-7725 1558-4550 |
| language | eng |
| recordid | cdi_ieee_primary_1609209 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Acceleration Computational modeling Costs Design engineering Performance evaluation Physics computing Power system modeling Process design Space technology System testing |
| title | Model-based design for test vector verification |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T05%3A31%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Model-based%20design%20for%20test%20vector%20verification&rft.btitle=IEEE%20Autotestcon,%202005&rft.au=Mosterman,%20P.J.&rft.date=2005&rft.spage=628&rft.epage=634&rft.pages=628-634&rft.issn=1088-7725&rft.eissn=1558-4550&rft.isbn=9780780391017&rft.isbn_list=0780391012&rft_id=info:doi/10.1109/AUTEST.2005.1609209&rft_dat=%3Cieee_6IE%3E1609209%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1609209&rfr_iscdi=true |