Uneven curing induced interfacial delamination of UV adhesive-bonded fiber array in V-groove for photonic packaging

The common approach to attaching a large number of fibers to a guided-wave device is to fabricate a linear array using V-grooves. UV-curable adhesives are used to attach the fiber in V-groove for the fabrication of fiber array. Interfacial delaminations at the adhesive fiber interfaces are common af...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of lightwave technology 2006-03, Vol.24 (3), p.1342-1349
Hauptverfasser: Uddin, M.A., Hau Ping Chan, Tsun, T.O., Chan, Y.C.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1349
container_issue 3
container_start_page 1342
container_title Journal of lightwave technology
container_volume 24
creator Uddin, M.A.
Hau Ping Chan
Tsun, T.O.
Chan, Y.C.
description The common approach to attaching a large number of fibers to a guided-wave device is to fabricate a linear array using V-grooves. UV-curable adhesives are used to attach the fiber in V-groove for the fabrication of fiber array. Interfacial delaminations at the adhesive fiber interfaces are common after the reliability test due to uneven curing of the UV adhesive. This paper investigated the causes of uneven curing that gave rise to delamination. An analytical ray tracing technique was used to estimate the variation in light intensity or shadowing during the UV curing of adhesive. These effects were found to be very severe when the refractive index difference between the adhesive and the cladding materials is very large. Based on this study, it can be concluded that the delamination problem can be minimized by selecting a UV-curable adhesive having the same refractive index of the cladding material. It is also recommended to light illuminate from the topside for fiber packaging
doi_str_mv 10.1109/JLT.2005.863329
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_1605336</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1605336</ieee_id><sourcerecordid>1022899509</sourcerecordid><originalsourceid>FETCH-LOGICAL-c414t-915d0a00799ce081baaf19998790d84dd19d7dd67747f850926363e0c460e04b3</originalsourceid><addsrcrecordid>eNp9kTtvGzEQhA9BAkRxXKdIQwTIozl5SR5fpWHkZQhwY7k9UOSeTOdEKuSdAP9705EBAylcbcFvhrszTfOBwpJSMGeXq-slAxBLLTln5lWzoELoljHKXzcLUJy3WrHubfOulDsA2nVaLZqyjnjASNycQ9ySEP3s0Nc5YR6sC3YkHke7C9FOIUWSBrK-IdbfYgkHbDcp-ooPYYOZ2JztfZWSm3abUzogGVIm-9s0pRgc2Vv3x27rL--bN4MdC54-zZNm_eP79cWvdnX18_fF-ap1He2m1lDhwQIoYxyCphtrB2qM0cqA15331HjlvVSqU4MWYJjkkiO4TgJCt-Enzdej7z6nvzOWqd-F4nAcbcQ0l14bWQOjilXyy4sk0yBqXLyC314EKTCmjanLVPTTf-hdmnOsB_daSqBMAFTo7Ai5nErJOPT7HHY231en_rHWvtbaP9baH2utis9PtrY4Ow7ZRhfKs0wJI-S_TT8euYCIz88SBK8pPQA8HKnK</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>866012500</pqid></control><display><type>article</type><title>Uneven curing induced interfacial delamination of UV adhesive-bonded fiber array in V-groove for photonic packaging</title><source>IEEE Electronic Library (IEL)</source><creator>Uddin, M.A. ; Hau Ping Chan ; Tsun, T.O. ; Chan, Y.C.</creator><creatorcontrib>Uddin, M.A. ; Hau Ping Chan ; Tsun, T.O. ; Chan, Y.C.</creatorcontrib><description>The common approach to attaching a large number of fibers to a guided-wave device is to fabricate a linear array using V-grooves. UV-curable adhesives are used to attach the fiber in V-groove for the fabrication of fiber array. Interfacial delaminations at the adhesive fiber interfaces are common after the reliability test due to uneven curing of the UV adhesive. This paper investigated the causes of uneven curing that gave rise to delamination. An analytical ray tracing technique was used to estimate the variation in light intensity or shadowing during the UV curing of adhesive. These effects were found to be very severe when the refractive index difference between the adhesive and the cladding materials is very large. Based on this study, it can be concluded that the delamination problem can be minimized by selecting a UV-curable adhesive having the same refractive index of the cladding material. It is also recommended to light illuminate from the topside for fiber packaging</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2005.863329</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Adhesives ; Applied sciences ; Arrays ; Bonding ; Circuit properties ; Cladding ; Curing ; Delaminating ; Delamination ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Fabrication ; fiber array ; Fibers ; Integrated optics. Optical fibers and wave guides ; Joining processes ; Materials selection ; Optical and optoelectronic circuits ; Optical fiber communications ; Optical fiber devices ; Optical fiber testing ; optical propagation ; Optical telecommunications ; Packaging ; Ray tracing ; Refractive index ; reliability ; Shadow mapping ; shadowing ; Telecommunications ; Telecommunications and information theory ; V-groove ; Vanadium</subject><ispartof>Journal of lightwave technology, 2006-03, Vol.24 (3), p.1342-1349</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-915d0a00799ce081baaf19998790d84dd19d7dd67747f850926363e0c460e04b3</citedby><cites>FETCH-LOGICAL-c414t-915d0a00799ce081baaf19998790d84dd19d7dd67747f850926363e0c460e04b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1605336$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1605336$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=17595673$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Uddin, M.A.</creatorcontrib><creatorcontrib>Hau Ping Chan</creatorcontrib><creatorcontrib>Tsun, T.O.</creatorcontrib><creatorcontrib>Chan, Y.C.</creatorcontrib><title>Uneven curing induced interfacial delamination of UV adhesive-bonded fiber array in V-groove for photonic packaging</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>The common approach to attaching a large number of fibers to a guided-wave device is to fabricate a linear array using V-grooves. UV-curable adhesives are used to attach the fiber in V-groove for the fabrication of fiber array. Interfacial delaminations at the adhesive fiber interfaces are common after the reliability test due to uneven curing of the UV adhesive. This paper investigated the causes of uneven curing that gave rise to delamination. An analytical ray tracing technique was used to estimate the variation in light intensity or shadowing during the UV curing of adhesive. These effects were found to be very severe when the refractive index difference between the adhesive and the cladding materials is very large. Based on this study, it can be concluded that the delamination problem can be minimized by selecting a UV-curable adhesive having the same refractive index of the cladding material. It is also recommended to light illuminate from the topside for fiber packaging</description><subject>Adhesives</subject><subject>Applied sciences</subject><subject>Arrays</subject><subject>Bonding</subject><subject>Circuit properties</subject><subject>Cladding</subject><subject>Curing</subject><subject>Delaminating</subject><subject>Delamination</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>fiber array</subject><subject>Fibers</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Joining processes</subject><subject>Materials selection</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical fiber communications</subject><subject>Optical fiber devices</subject><subject>Optical fiber testing</subject><subject>optical propagation</subject><subject>Optical telecommunications</subject><subject>Packaging</subject><subject>Ray tracing</subject><subject>Refractive index</subject><subject>reliability</subject><subject>Shadow mapping</subject><subject>shadowing</subject><subject>Telecommunications</subject><subject>Telecommunications and information theory</subject><subject>V-groove</subject><subject>Vanadium</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kTtvGzEQhA9BAkRxXKdIQwTIozl5SR5fpWHkZQhwY7k9UOSeTOdEKuSdAP9705EBAylcbcFvhrszTfOBwpJSMGeXq-slAxBLLTln5lWzoELoljHKXzcLUJy3WrHubfOulDsA2nVaLZqyjnjASNycQ9ySEP3s0Nc5YR6sC3YkHke7C9FOIUWSBrK-IdbfYgkHbDcp-ooPYYOZ2JztfZWSm3abUzogGVIm-9s0pRgc2Vv3x27rL--bN4MdC54-zZNm_eP79cWvdnX18_fF-ap1He2m1lDhwQIoYxyCphtrB2qM0cqA15331HjlvVSqU4MWYJjkkiO4TgJCt-Enzdej7z6nvzOWqd-F4nAcbcQ0l14bWQOjilXyy4sk0yBqXLyC314EKTCmjanLVPTTf-hdmnOsB_daSqBMAFTo7Ai5nErJOPT7HHY231en_rHWvtbaP9baH2utis9PtrY4Ow7ZRhfKs0wJI-S_TT8euYCIz88SBK8pPQA8HKnK</recordid><startdate>20060301</startdate><enddate>20060301</enddate><creator>Uddin, M.A.</creator><creator>Hau Ping Chan</creator><creator>Tsun, T.O.</creator><creator>Chan, Y.C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20060301</creationdate><title>Uneven curing induced interfacial delamination of UV adhesive-bonded fiber array in V-groove for photonic packaging</title><author>Uddin, M.A. ; Hau Ping Chan ; Tsun, T.O. ; Chan, Y.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c414t-915d0a00799ce081baaf19998790d84dd19d7dd67747f850926363e0c460e04b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Adhesives</topic><topic>Applied sciences</topic><topic>Arrays</topic><topic>Bonding</topic><topic>Circuit properties</topic><topic>Cladding</topic><topic>Curing</topic><topic>Delaminating</topic><topic>Delamination</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fabrication</topic><topic>fiber array</topic><topic>Fibers</topic><topic>Integrated optics. Optical fibers and wave guides</topic><topic>Joining processes</topic><topic>Materials selection</topic><topic>Optical and optoelectronic circuits</topic><topic>Optical fiber communications</topic><topic>Optical fiber devices</topic><topic>Optical fiber testing</topic><topic>optical propagation</topic><topic>Optical telecommunications</topic><topic>Packaging</topic><topic>Ray tracing</topic><topic>Refractive index</topic><topic>reliability</topic><topic>Shadow mapping</topic><topic>shadowing</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><topic>V-groove</topic><topic>Vanadium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Uddin, M.A.</creatorcontrib><creatorcontrib>Hau Ping Chan</creatorcontrib><creatorcontrib>Tsun, T.O.</creatorcontrib><creatorcontrib>Chan, Y.C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Uddin, M.A.</au><au>Hau Ping Chan</au><au>Tsun, T.O.</au><au>Chan, Y.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Uneven curing induced interfacial delamination of UV adhesive-bonded fiber array in V-groove for photonic packaging</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2006-03-01</date><risdate>2006</risdate><volume>24</volume><issue>3</issue><spage>1342</spage><epage>1349</epage><pages>1342-1349</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>The common approach to attaching a large number of fibers to a guided-wave device is to fabricate a linear array using V-grooves. UV-curable adhesives are used to attach the fiber in V-groove for the fabrication of fiber array. Interfacial delaminations at the adhesive fiber interfaces are common after the reliability test due to uneven curing of the UV adhesive. This paper investigated the causes of uneven curing that gave rise to delamination. An analytical ray tracing technique was used to estimate the variation in light intensity or shadowing during the UV curing of adhesive. These effects were found to be very severe when the refractive index difference between the adhesive and the cladding materials is very large. Based on this study, it can be concluded that the delamination problem can be minimized by selecting a UV-curable adhesive having the same refractive index of the cladding material. It is also recommended to light illuminate from the topside for fiber packaging</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JLT.2005.863329</doi><tpages>8</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0733-8724
ispartof Journal of lightwave technology, 2006-03, Vol.24 (3), p.1342-1349
issn 0733-8724
1558-2213
language eng
recordid cdi_ieee_primary_1605336
source IEEE Electronic Library (IEL)
subjects Adhesives
Applied sciences
Arrays
Bonding
Circuit properties
Cladding
Curing
Delaminating
Delamination
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fabrication
fiber array
Fibers
Integrated optics. Optical fibers and wave guides
Joining processes
Materials selection
Optical and optoelectronic circuits
Optical fiber communications
Optical fiber devices
Optical fiber testing
optical propagation
Optical telecommunications
Packaging
Ray tracing
Refractive index
reliability
Shadow mapping
shadowing
Telecommunications
Telecommunications and information theory
V-groove
Vanadium
title Uneven curing induced interfacial delamination of UV adhesive-bonded fiber array in V-groove for photonic packaging
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T18%3A09%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Uneven%20curing%20induced%20interfacial%20delamination%20of%20UV%20adhesive-bonded%20fiber%20array%20in%20V-groove%20for%20photonic%20packaging&rft.jtitle=Journal%20of%20lightwave%20technology&rft.au=Uddin,%20M.A.&rft.date=2006-03-01&rft.volume=24&rft.issue=3&rft.spage=1342&rft.epage=1349&rft.pages=1342-1349&rft.issn=0733-8724&rft.eissn=1558-2213&rft.coden=JLTEDG&rft_id=info:doi/10.1109/JLT.2005.863329&rft_dat=%3Cproquest_RIE%3E1022899509%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=866012500&rft_id=info:pmid/&rft_ieee_id=1605336&rfr_iscdi=true