Dielectric Charge Measurement in Capacitive Microwave Shunt Switches
The use of microelectromechanical systems as electronic switches in circuits for microwave frequency applications has grown considerably in the past decade. One phenomenon that limits the reliability of these switches is dielectric charging. Using a non-contact technique for measuring dielectric cha...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1349 |
|---|---|
| container_issue | |
| container_start_page | 1345 |
| container_title | |
| container_volume | 2 |
| creator | Schultz, J.S. Firebaugh, S.L. Charles, H.K. Edwards, R.L. Keeney, A.C. Wilderson, S.F. |
| description | The use of microelectromechanical systems as electronic switches in circuits for microwave frequency applications has grown considerably in the past decade. One phenomenon that limits the reliability of these switches is dielectric charging. Using a non-contact technique for measuring dielectric charging, the rate at which dielectric charging occurs can be measured and used to predict further charging. The prediction of dielectric charging can help optimize the controllable variables to minimize the extent of the phenomenon |
| doi_str_mv | 10.1109/IMTC.2005.1604367 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1604367</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1604367</ieee_id><sourcerecordid>1604367</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-3ec9eab8c72c1a1604429970ebb885d35af1f0da7c180769db04f58060dd3d5d3</originalsourceid><addsrcrecordid>eNotT9tKw0AUXFDBWvsB4kt-IPFsNtnLo6RaCy0-NO_lZPfErLS1bLYW_94VCwMzMMMww9gDh4JzME_LddsUJUBdcAmVkOqKzYzSkCC0VkZes0nK8bwuNb9ld-P4CQCyUmrC5nNPO7IxeJs1A4YPytaE4ynQng4x84eswSNaH_13crwNX2dMajOckrs5-2gHGu_ZTY-7kWYXnrL29aVt3vLV-2LZPK9ybyDmgqwh7LRVpeX4N7UqjVFAXad17USNPe_BobI8bZfGdVD1tQYJzgmXAlP2-F_riWh7DH6P4Wd7-Sx-ARNfSv0</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Dielectric Charge Measurement in Capacitive Microwave Shunt Switches</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Schultz, J.S. ; Firebaugh, S.L. ; Charles, H.K. ; Edwards, R.L. ; Keeney, A.C. ; Wilderson, S.F.</creator><creatorcontrib>Schultz, J.S. ; Firebaugh, S.L. ; Charles, H.K. ; Edwards, R.L. ; Keeney, A.C. ; Wilderson, S.F.</creatorcontrib><description>The use of microelectromechanical systems as electronic switches in circuits for microwave frequency applications has grown considerably in the past decade. One phenomenon that limits the reliability of these switches is dielectric charging. Using a non-contact technique for measuring dielectric charging, the rate at which dielectric charging occurs can be measured and used to predict further charging. The prediction of dielectric charging can help optimize the controllable variables to minimize the extent of the phenomenon</description><identifier>ISSN: 1091-5281</identifier><identifier>ISBN: 9780780388796</identifier><identifier>ISBN: 0780388798</identifier><identifier>DOI: 10.1109/IMTC.2005.1604367</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bridge circuits ; Charge measurement ; Communication switching ; Conductors ; dielectric charging ; Dielectric measurements ; Electrostatics ; MEMS ; Microelectromechanical devices ; micromachining ; Micromechanical devices ; microwave ; Power semiconductor switches ; Radiofrequency microelectromechanical systems ; reliability ; switches ; Voltage</subject><ispartof>2005 IEEE Instrumentationand Measurement Technology Conference Proceedings, 2005, Vol.2, p.1345-1349</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1604367$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1604367$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Schultz, J.S.</creatorcontrib><creatorcontrib>Firebaugh, S.L.</creatorcontrib><creatorcontrib>Charles, H.K.</creatorcontrib><creatorcontrib>Edwards, R.L.</creatorcontrib><creatorcontrib>Keeney, A.C.</creatorcontrib><creatorcontrib>Wilderson, S.F.</creatorcontrib><title>Dielectric Charge Measurement in Capacitive Microwave Shunt Switches</title><title>2005 IEEE Instrumentationand Measurement Technology Conference Proceedings</title><addtitle>IMTC</addtitle><description>The use of microelectromechanical systems as electronic switches in circuits for microwave frequency applications has grown considerably in the past decade. One phenomenon that limits the reliability of these switches is dielectric charging. Using a non-contact technique for measuring dielectric charging, the rate at which dielectric charging occurs can be measured and used to predict further charging. The prediction of dielectric charging can help optimize the controllable variables to minimize the extent of the phenomenon</description><subject>Bridge circuits</subject><subject>Charge measurement</subject><subject>Communication switching</subject><subject>Conductors</subject><subject>dielectric charging</subject><subject>Dielectric measurements</subject><subject>Electrostatics</subject><subject>MEMS</subject><subject>Microelectromechanical devices</subject><subject>micromachining</subject><subject>Micromechanical devices</subject><subject>microwave</subject><subject>Power semiconductor switches</subject><subject>Radiofrequency microelectromechanical systems</subject><subject>reliability</subject><subject>switches</subject><subject>Voltage</subject><issn>1091-5281</issn><isbn>9780780388796</isbn><isbn>0780388798</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT9tKw0AUXFDBWvsB4kt-IPFsNtnLo6RaCy0-NO_lZPfErLS1bLYW_94VCwMzMMMww9gDh4JzME_LddsUJUBdcAmVkOqKzYzSkCC0VkZes0nK8bwuNb9ld-P4CQCyUmrC5nNPO7IxeJs1A4YPytaE4ynQng4x84eswSNaH_13crwNX2dMajOckrs5-2gHGu_ZTY-7kWYXnrL29aVt3vLV-2LZPK9ybyDmgqwh7LRVpeX4N7UqjVFAXad17USNPe_BobI8bZfGdVD1tQYJzgmXAlP2-F_riWh7DH6P4Wd7-Sx-ARNfSv0</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Schultz, J.S.</creator><creator>Firebaugh, S.L.</creator><creator>Charles, H.K.</creator><creator>Edwards, R.L.</creator><creator>Keeney, A.C.</creator><creator>Wilderson, S.F.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>Dielectric Charge Measurement in Capacitive Microwave Shunt Switches</title><author>Schultz, J.S. ; Firebaugh, S.L. ; Charles, H.K. ; Edwards, R.L. ; Keeney, A.C. ; Wilderson, S.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-3ec9eab8c72c1a1604429970ebb885d35af1f0da7c180769db04f58060dd3d5d3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Bridge circuits</topic><topic>Charge measurement</topic><topic>Communication switching</topic><topic>Conductors</topic><topic>dielectric charging</topic><topic>Dielectric measurements</topic><topic>Electrostatics</topic><topic>MEMS</topic><topic>Microelectromechanical devices</topic><topic>micromachining</topic><topic>Micromechanical devices</topic><topic>microwave</topic><topic>Power semiconductor switches</topic><topic>Radiofrequency microelectromechanical systems</topic><topic>reliability</topic><topic>switches</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Schultz, J.S.</creatorcontrib><creatorcontrib>Firebaugh, S.L.</creatorcontrib><creatorcontrib>Charles, H.K.</creatorcontrib><creatorcontrib>Edwards, R.L.</creatorcontrib><creatorcontrib>Keeney, A.C.</creatorcontrib><creatorcontrib>Wilderson, S.F.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schultz, J.S.</au><au>Firebaugh, S.L.</au><au>Charles, H.K.</au><au>Edwards, R.L.</au><au>Keeney, A.C.</au><au>Wilderson, S.F.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Dielectric Charge Measurement in Capacitive Microwave Shunt Switches</atitle><btitle>2005 IEEE Instrumentationand Measurement Technology Conference Proceedings</btitle><stitle>IMTC</stitle><date>2005</date><risdate>2005</risdate><volume>2</volume><spage>1345</spage><epage>1349</epage><pages>1345-1349</pages><issn>1091-5281</issn><isbn>9780780388796</isbn><isbn>0780388798</isbn><abstract>The use of microelectromechanical systems as electronic switches in circuits for microwave frequency applications has grown considerably in the past decade. One phenomenon that limits the reliability of these switches is dielectric charging. Using a non-contact technique for measuring dielectric charging, the rate at which dielectric charging occurs can be measured and used to predict further charging. The prediction of dielectric charging can help optimize the controllable variables to minimize the extent of the phenomenon</abstract><pub>IEEE</pub><doi>10.1109/IMTC.2005.1604367</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1091-5281 |
| ispartof | 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings, 2005, Vol.2, p.1345-1349 |
| issn | 1091-5281 |
| language | eng |
| recordid | cdi_ieee_primary_1604367 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Bridge circuits Charge measurement Communication switching Conductors dielectric charging Dielectric measurements Electrostatics MEMS Microelectromechanical devices micromachining Micromechanical devices microwave Power semiconductor switches Radiofrequency microelectromechanical systems reliability switches Voltage |
| title | Dielectric Charge Measurement in Capacitive Microwave Shunt Switches |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T09%3A56%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Dielectric%20Charge%20Measurement%20in%20Capacitive%20Microwave%20Shunt%20Switches&rft.btitle=2005%20IEEE%20Instrumentationand%20Measurement%20Technology%20Conference%20Proceedings&rft.au=Schultz,%20J.S.&rft.date=2005&rft.volume=2&rft.spage=1345&rft.epage=1349&rft.pages=1345-1349&rft.issn=1091-5281&rft.isbn=9780780388796&rft.isbn_list=0780388798&rft_id=info:doi/10.1109/IMTC.2005.1604367&rft_dat=%3Cieee_6IE%3E1604367%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1604367&rfr_iscdi=true |