Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach
Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modifies the faulty behavior of the memory. This paper introduces an analytical (equation-based) method to give a rough analysis of the...
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| creator | Al-Ars, Z. Vollrath, J. Hamdioui, S. |
| description | Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modifies the faulty behavior of the memory. This paper introduces an analytical (equation-based) method to give a rough analysis of the faulty behavior of cell opens in the memory, that simplifies the understanding and identifies the major factors responsible for the faulty behavior. Having these factors makes it easier to optimize the circuit and allows extrapolation of the behavior of future technologies. The paper also compares the results of the analytical approach with those from the simulation-based analysis and discusses the advantages and disadvantages of both |
| doi_str_mv | 10.1109/ATS.2005.71 |
| format | Conference Proceeding |
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| ispartof | 14th Asian Test Symposium (ATS'05), 2005, p.434-439 |
| issn | 1081-7735 2377-5386 |
| language | eng |
| recordid | cdi_ieee_primary_1575468 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | analytical evaluation Analytical models Circuit faults Circuit simulation Circuit testing Computer aided manufacturing defect simulation DRAMs Equations Fabrication Fault diagnosis faulty behavior memory testing Predictive models Random access memory |
| title | Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach |
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