Efficient Test Compaction for Pseudo-Random Testing

Compact set of 3-valued test vectors for random pattern resistant faults are covered in multiple test passes. During a pass, its associated test cube specifies certain bits in the scan chain to be held fixed and others to change pseudo -randomly. We propose an algorithm to find a small number of cub...

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Bibliographische Detailangaben

Hauptverfasser:	Sheng Zhang, Seth, S.C., Bhattacharya, B.B.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	built-in testing Compaction Logic testing pseudo-random testing Test compaction test-data compression
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