Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K

Technique for measurement of low loss dielectric and semiconductor materials at frequencies 30-140 GHz and temperatures T=0.6-300 K is presented. Features of the experimental low temperature complex are described. Whispering gallery disk dielectric resonator (WGDDR) method is applied to measure loss...

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Bibliographische Detailangaben

Hauptverfasser:	Derkach, V.N., Golovashehenko, R.V., Nedukh, S.V., Plevako, A.S., Tarapov, S.I.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Dielectric loss measurement Dielectric losses Dielectric materials Dielectric measurements Frequency measurement Loss measurement Millimeter wave measurements Millimeter wave technology Semiconductor materials Temperature
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