Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K
Technique for measurement of low loss dielectric and semiconductor materials at frequencies 30-140 GHz and temperatures T=0.6-300 K is presented. Features of the experimental low temperature complex are described. Whispering gallery disk dielectric resonator (WGDDR) method is applied to measure loss...
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| creator | Derkach, V.N. Golovashehenko, R.V. Nedukh, S.V. Plevako, A.S. Tarapov, S.I. |
| description | Technique for measurement of low loss dielectric and semiconductor materials at frequencies 30-140 GHz and temperatures T=0.6-300 K is presented. Features of the experimental low temperature complex are described. Whispering gallery disk dielectric resonator (WGDDR) method is applied to measure loss tangent for several promising technology materials. Temperature dependences of loss tangents are obtained for materials under test and presented in report. |
| doi_str_mv | 10.1109/ICIMW.2005.1572473 |
| format | Conference Proceeding |
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Temperature dependences of loss tangents are obtained for materials under test and presented in report.</description><subject>Dielectric loss measurement</subject><subject>Dielectric losses</subject><subject>Dielectric materials</subject><subject>Dielectric measurements</subject><subject>Frequency measurement</subject><subject>Loss measurement</subject><subject>Millimeter wave measurements</subject><subject>Millimeter wave technology</subject><subject>Semiconductor materials</subject><subject>Temperature</subject><issn>2162-2027</issn><isbn>9780780393486</isbn><isbn>0780393481</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotUF1LAzEQDKhgqfcH9CV_4M7Nx12SRyl-FFt8KfhY0mRPIpe7kqSK_95DCwvDzu7MwBByy6BhDMz9erXevjccoG1Yq7hU4oJURmmYRxghdXdJFpx1vObA1TWpcv4EAMHnqzQLUrZo8ylhxLHQqafDlDMtdvw47z7ggK6k4KgdPc0Yg5tGf3JlSjTaginYIVNbaAzDECLODP22X5j__gvGIyZb5oRMoTG1AKCvN-Sqn1VYnXFJdk-Pu9VLvXl7Xq8eNnUwUGrVeS691tgh4gxMKg5Ma9W7VjELHRojnbDCG6Nkdzho2ZsWoXfe9t5ZsSR3_7ZhNtgfU4g2_ezPNYlfMNldWg</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Derkach, V.N.</creator><creator>Golovashehenko, R.V.</creator><creator>Nedukh, S.V.</creator><creator>Plevako, A.S.</creator><creator>Tarapov, S.I.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2005</creationdate><title>Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K</title><author>Derkach, V.N. ; Golovashehenko, R.V. ; Nedukh, S.V. ; Plevako, A.S. ; Tarapov, S.I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-76d24d88e6eee88e147201887fc571a06e994c3a3d99746bb84f95e0fcdafdca3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Dielectric loss measurement</topic><topic>Dielectric losses</topic><topic>Dielectric materials</topic><topic>Dielectric measurements</topic><topic>Frequency measurement</topic><topic>Loss measurement</topic><topic>Millimeter wave measurements</topic><topic>Millimeter wave technology</topic><topic>Semiconductor materials</topic><topic>Temperature</topic><toplevel>online_resources</toplevel><creatorcontrib>Derkach, V.N.</creatorcontrib><creatorcontrib>Golovashehenko, R.V.</creatorcontrib><creatorcontrib>Nedukh, S.V.</creatorcontrib><creatorcontrib>Plevako, A.S.</creatorcontrib><creatorcontrib>Tarapov, S.I.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Derkach, V.N.</au><au>Golovashehenko, R.V.</au><au>Nedukh, S.V.</au><au>Plevako, A.S.</au><au>Tarapov, S.I.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K</atitle><btitle>2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics</btitle><stitle>ICIMW</stitle><date>2005</date><risdate>2005</risdate><volume>1</volume><spage>192</spage><epage>193 vol. 1</epage><pages>192-193 vol. 1</pages><issn>2162-2027</issn><isbn>9780780393486</isbn><isbn>0780393481</isbn><abstract>Technique for measurement of low loss dielectric and semiconductor materials at frequencies 30-140 GHz and temperatures T=0.6-300 K is presented. Features of the experimental low temperature complex are described. Whispering gallery disk dielectric resonator (WGDDR) method is applied to measure loss tangent for several promising technology materials. Temperature dependences of loss tangents are obtained for materials under test and presented in report.</abstract><pub>IEEE</pub><doi>10.1109/ICIMW.2005.1572473</doi></addata></record> |
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| identifier | ISSN: 2162-2027 |
| ispartof | 2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005, Vol.1, p.192-193 vol. 1 |
| issn | 2162-2027 |
| language | eng |
| recordid | cdi_ieee_primary_1572473 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Dielectric loss measurement Dielectric losses Dielectric materials Dielectric measurements Frequency measurement Loss measurement Millimeter wave measurements Millimeter wave technology Semiconductor materials Temperature |
| title | Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K |
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