Scaling of analog-to-digital converters into ultra-deep-submicron CMOS

This paper presents the opportunities and challenges for scaling A/D converters into ultra-deep-submicron CMOS technologies. With faster transistors and better matching, the trend is to migrate into higher sample rates with lower resolutions. Limited dynamic range at low supply voltages remains the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Chiu, Y., Nikolic, B., Gray, P.R.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analog-digital conversion Calibration Circuits CMOS technology Dynamic range Dynamic voltage scaling Frequency Linearity Low voltage Threshold voltage
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