Neural network based technique for detecting catastrophic and parametric faults in analog circuits
The approach to transient functional test of analog circuits is considered. The artificial neural network is proposed for realization of the circuit under test (CUT) response analysis. The coefficients of wavelet decomposition of CUT transient output responses reflecting the dynamical behavior of an...
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| creator | Mosin, S.G. |
| description | The approach to transient functional test of analog circuits is considered. The artificial neural network is proposed for realization of the circuit under test (CUT) response analysis. The coefficients of wavelet decomposition of CUT transient output responses reflecting the dynamical behavior of analog circuit are used for neural network training sensitivity analysis is applied for selecting the test frequencies and test nodes. The experimental results for analog benchmark circuits are provided. |
| doi_str_mv | 10.1109/ICSENG.2005.58 |
| format | Conference Proceeding |
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The artificial neural network is proposed for realization of the circuit under test (CUT) response analysis. The coefficients of wavelet decomposition of CUT transient output responses reflecting the dynamical behavior of analog circuit are used for neural network training sensitivity analysis is applied for selecting the test frequencies and test nodes. The experimental results for analog benchmark circuits are provided.</description><subject>Analog circuits</subject><subject>Artificial neural networks</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Electrical fault detection</subject><subject>Fault detection</subject><subject>Neural networks</subject><subject>Sensitivity analysis</subject><subject>Transient analysis</subject><subject>Wavelet analysis</subject><isbn>0769523595</isbn><isbn>9780769523590</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjE1Lw0AURQdEUGu3btzMH0idl_nKLCXUWih1oa7LS_JiR9MkzkwQ_72BejeXw7lcxu5ArACEe9iWr-v9ZpULoVe6uGA3whqnc6mdvmLLGD_FHOmMcuaaVXuaAna8p_QzhC9eYaSGJ6qPvf-eiLdD4A3NnHz_wWtMGFMYxqOvOfYNHzHgiVKYscWpS5H7fhbYDfPYh3ryKd6yyxa7SMv_XrD3p_Vb-ZztXjbb8nGXebA6ZUVj21opbaByUBCKAiwKB4qMEeAECMRKSZu3pjWqEkbWEhqtrYLKoAW5YPfnX09EhzH4E4bfA2iTF9rIP9mtU28</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Mosin, S.G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2005</creationdate><title>Neural network based technique for detecting catastrophic and parametric faults in analog circuits</title><author>Mosin, S.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-8d7fc44561b918ea0817a0914e66019010aab4372f6f64b063c31d55741b6a713</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Analog circuits</topic><topic>Artificial neural networks</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Electrical fault detection</topic><topic>Fault detection</topic><topic>Neural networks</topic><topic>Sensitivity analysis</topic><topic>Transient analysis</topic><topic>Wavelet analysis</topic><toplevel>online_resources</toplevel><creatorcontrib>Mosin, S.G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mosin, S.G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Neural network based technique for detecting catastrophic and parametric faults in analog circuits</atitle><btitle>18th International Conference on Systems Engineering (ICSEng'05)</btitle><stitle>ICSENG</stitle><date>2005</date><risdate>2005</risdate><spage>224</spage><epage>229</epage><pages>224-229</pages><isbn>0769523595</isbn><isbn>9780769523590</isbn><abstract>The approach to transient functional test of analog circuits is considered. The artificial neural network is proposed for realization of the circuit under test (CUT) response analysis. The coefficients of wavelet decomposition of CUT transient output responses reflecting the dynamical behavior of analog circuit are used for neural network training sensitivity analysis is applied for selecting the test frequencies and test nodes. The experimental results for analog benchmark circuits are provided.</abstract><pub>IEEE</pub><doi>10.1109/ICSENG.2005.58</doi><tpages>6</tpages></addata></record> |
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| identifier | ISBN: 0769523595 |
| ispartof | 18th International Conference on Systems Engineering (ICSEng'05), 2005, p.224-229 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Analog circuits Artificial neural networks Circuit faults Circuit testing Electrical fault detection Fault detection Neural networks Sensitivity analysis Transient analysis Wavelet analysis |
| title | Neural network based technique for detecting catastrophic and parametric faults in analog circuits |
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