Phase noise performance comparison between LIGA-MEMS and on-chip CMOS capacitors for a VCO application

An integrated voltage-controlled oscillator using TSMC 0.18 mum CMOS technology is presented to demonstrate and compare the phase noise performance between the VCO using a new type of MEMS variable capacitor and that using conventional CMOS varactor, which is built on-chip together with the CMOS VCO...

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Hauptverfasser: Fang, L., Klymyshyn, D., Dinh, A., Haluzan, D., Achenbach, S.
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Dinh, A.
Haluzan, D.
Achenbach, S.
description An integrated voltage-controlled oscillator using TSMC 0.18 mum CMOS technology is presented to demonstrate and compare the phase noise performance between the VCO using a new type of MEMS variable capacitor and that using conventional CMOS varactor, which is built on-chip together with the CMOS VCO. A representative MEMS variable capacitor, fabricated using the LIGA process, has a nominal capacitance of 1.05 pF and exhibits a Q factor of 40.9 at 2.7 GHz. The simulation results show that with this LIGA-MEMS capacitor, a 4.3 dB of phase noise improvement at 300 kHz offset from the carrier is achieved when the VCO operates at 2.7 GHz
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subjects Capacitance
Capacitors
CMOS technology
Electrodes
Frequency
Micromechanical devices
Phase noise
Q factor
Varactors
Voltage-controlled oscillators
title Phase noise performance comparison between LIGA-MEMS and on-chip CMOS capacitors for a VCO application
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