Modeling QCA defects at molecular-level in combinational circuits

This paper analyzes the deposition defects in devices and circuits made of quantum-dot cellular automata (QCA) for molecular implementation. Differently from metal-based QCA, in this type of implementation a defect may occur due to the erroneous deposition of cells (made of molecules) on a substrate...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Momenzadeh, M., Ottavi, M., Lombardi, F.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Circuit simulation Circuit testing CMOS logic circuits CMOS technology Combinational circuits defect tolerance emerging technology fault model Integrated circuit technology QCA Quantum cellular automata Quantum dots Semiconductor device modeling
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