Defect characterization and tolerance of QCA sequential devices and circuits

This paper analyzes the defect tolerance of sequential devices and circuits implemented by molecular quantum-dot cellular automata (QCA). Initially, a novel QCA SR-type flip-flop is proposed; this flip-flop is the first sequential device for QCA and it takes into account the timing issues associated...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Momenzadeh, M., Huang, J., Lombardi, F.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Circuit simulation Flip-flops Inverters Logic devices Quantum cellular automata Quantum dots Sequential circuits Timing Very large scale integration
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