Noise analysis of fault tolerant active pixel sensors

As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant active pixel sensor (APS) has previously been designed and fabricated that can correct for stuck high and stuck low defects. Analyses of the pixel noise for a standard A...

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Bibliographische Detailangaben

Hauptverfasser:	Jung, C., Izadi, M.H., La Haye, M.L., Chapman, G.H., Karim, K.S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	1f noise Active noise reduction Dark current Digital images Fault tolerance Lighting Operational amplifiers Photoconductivity Pixel Thermal resistance
Online-Zugang:	Volltext bestellen
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