Si/Si(0.64)Ge(0.36)/Si pMOSFETs with Enhanced Voltage Gain and Low 1/f Noise

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Hauptverfasser: Prest, M.J., Palmer, M.J., Braithwaite, G., Grasby, T.J., Phillips, P.J., Mironov, O.A., Parker, E.H.C., Whall, T.E., Waite, A.M., Evans, A.G.R.
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creator Prest, M.J.
Palmer, M.J.
Braithwaite, G.
Grasby, T.J.
Phillips, P.J.
Mironov, O.A.
Parker, E.H.C.
Whall, T.E.
Waite, A.M.
Evans, A.G.R.
description
doi_str_mv 10.1109/ESSDERC.2001.195230
format Conference Proceeding
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identifier ISBN: 9782914601016
ispartof 31st European Solid-State Device Research Conference, 2001, p.179-182
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language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Computer science
Frequency
Germanium silicon alloys
Low voltage
MOSFETs
Noise reduction
Oxidation
Physics
Silicon germanium
Transconductance
title Si/Si(0.64)Ge(0.36)/Si pMOSFETs with Enhanced Voltage Gain and Low 1/f Noise
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