Controlling the TCR of thin film resistors

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Hauptverfasser:	Steinmann, P., Jacobsen, S.M., Higgins, R.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Charge carriers Conductive films Conductivity Electrons Resistors Scattering Surface resistance Temperature distribution Transistors Tunneling
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creator	Steinmann, P. Jacobsen, S.M. Higgins, R.
description
doi_str_mv	10.1109/ESSDERC.2000.194812
format	Conference Proceeding
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identifier	ISBN: 9782863322482
ispartof	30th European Solid-State Device Research Conference, 2000, p.452-455
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language	eng
recordid	cdi_ieee_primary_1503742
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Charge carriers Conductive films Conductivity Electrons Resistors Scattering Surface resistance Temperature distribution Transistors Tunneling
title	Controlling the TCR of thin film resistors
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