Thermal analytical model for analysis of pulsed DC electromigration results

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Hauptverfasser:	Waltz, P., Lormand, G., Arnaud, L.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analytical models Electromigration Equations Frequency Heating Power system modeling Temperature Testing Thermal resistance Thermal stresses
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creator	Waltz, P. Lormand, G. Arnaud, L.
description
doi_str_mv	10.1109/ESSDERC.1997.194471
format	Conference Proceeding
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identifier	ISBN: 2863322214
ispartof	27th European Solid-State Device Research Conference, 1997, p.484-487
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language	eng
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Analytical models Electromigration Equations Frequency Heating Power system modeling Temperature Testing Thermal resistance Thermal stresses
title	Thermal analytical model for analysis of pulsed DC electromigration results
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