Delay-fault diagnosis using timing information

In modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. Unfortunately, the resolution of the existing delay-fault diagnostic methodologies is still unsatisfactory. In this paper,...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2005-09, Vol.24 (9), p.1315-1325
Hauptverfasser:	Zhiyuan Wang, Marek-Sadowska, M.M., Tsai, K.-H., Rajski, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical models Circuit faults Circuit simulation Computational modeling Computer graphics Delay testing Failure analysis fault diagnosis logic simulation Logic testing Propagation delay simulation Time to market Timing timing analysis
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