DEP-base particle counting device
The research disclosed a particle-counting device which can reliably count particles in the fixed quantity of sample solution. Let sample drop in the chip inlet, then use dielectrophoresis (DEP) force produced by separation device on the chip to separate and move specific particles to micro-pore. Hi...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1631 Vol. 2 |
|---|---|
| container_issue | |
| container_start_page | 1628 |
| container_title | |
| container_volume | 2 |
| creator | Jung-Tang Huang Yu-Jen Lai Shao-Chang Cheng Sheng-Hsiung Shih |
| description | The research disclosed a particle-counting device which can reliably count particles in the fixed quantity of sample solution. Let sample drop in the chip inlet, then use dielectrophoresis (DEP) force produced by separation device on the chip to separate and move specific particles to micro-pore. High reliable Coulter principle had been introduced on this device. When the particles pass through the micro-pore one by one, recording the numbers of ion current reduction events can correctly count the quantity of specific particles in the fixed volume of sample solution. |
| doi_str_mv | 10.1109/SENSOR.2005.1497400 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1497400</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1497400</ieee_id><sourcerecordid>1497400</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-c88049a79eaa13122636700162178f31b5c399816e45845c17c992920c8aeef13</originalsourceid><addsrcrecordid>eNotj8tKA0EQAAdUMMZ8QS7rB8zaPc_uo8Q1CsGIUfAWJmOvjMQYdlfBv1cwdalbQSk1RagRgS9Xzf1q-VgbAF-j4-gAjtQZRAJLzI6O1cigZ-1dfDlVk75_hz8sB880UhfXzYPepF6qfeqGkrdS5c-v3VB2b9WrfJcs5-qkTdteJgeP1fNN8zS71Yvl_G52tdAFox90JgLHKbKkhBaNCTZEAAwGI7UWNz5bZsIgzpPzGWNmNmwgUxJp0Y7V9L9bRGS978pH6n7WhyP7CxmxPOw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>DEP-base particle counting device</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Jung-Tang Huang ; Yu-Jen Lai ; Shao-Chang Cheng ; Sheng-Hsiung Shih</creator><creatorcontrib>Jung-Tang Huang ; Yu-Jen Lai ; Shao-Chang Cheng ; Sheng-Hsiung Shih</creatorcontrib><description>The research disclosed a particle-counting device which can reliably count particles in the fixed quantity of sample solution. Let sample drop in the chip inlet, then use dielectrophoresis (DEP) force produced by separation device on the chip to separate and move specific particles to micro-pore. High reliable Coulter principle had been introduced on this device. When the particles pass through the micro-pore one by one, recording the numbers of ion current reduction events can correctly count the quantity of specific particles in the fixed volume of sample solution.</description><identifier>ISSN: 2159-547X</identifier><identifier>ISBN: 0780389948</identifier><identifier>ISBN: 9780780389946</identifier><identifier>DOI: 10.1109/SENSOR.2005.1497400</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductivity ; Counting circuits ; Dielectrophoresis ; Electric resistance ; Electric variables measurement ; Frequency ; Particle measurements ; Permittivity ; Polarization ; Semiconductor device measurement</subject><ispartof>The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05, 2005, Vol.2, p.1628-1631 Vol. 2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1497400$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1497400$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Jung-Tang Huang</creatorcontrib><creatorcontrib>Yu-Jen Lai</creatorcontrib><creatorcontrib>Shao-Chang Cheng</creatorcontrib><creatorcontrib>Sheng-Hsiung Shih</creatorcontrib><title>DEP-base particle counting device</title><title>The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05</title><addtitle>SENSOR</addtitle><description>The research disclosed a particle-counting device which can reliably count particles in the fixed quantity of sample solution. Let sample drop in the chip inlet, then use dielectrophoresis (DEP) force produced by separation device on the chip to separate and move specific particles to micro-pore. High reliable Coulter principle had been introduced on this device. When the particles pass through the micro-pore one by one, recording the numbers of ion current reduction events can correctly count the quantity of specific particles in the fixed volume of sample solution.</description><subject>Conductivity</subject><subject>Counting circuits</subject><subject>Dielectrophoresis</subject><subject>Electric resistance</subject><subject>Electric variables measurement</subject><subject>Frequency</subject><subject>Particle measurements</subject><subject>Permittivity</subject><subject>Polarization</subject><subject>Semiconductor device measurement</subject><issn>2159-547X</issn><isbn>0780389948</isbn><isbn>9780780389946</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKA0EQAAdUMMZ8QS7rB8zaPc_uo8Q1CsGIUfAWJmOvjMQYdlfBv1cwdalbQSk1RagRgS9Xzf1q-VgbAF-j4-gAjtQZRAJLzI6O1cigZ-1dfDlVk75_hz8sB880UhfXzYPepF6qfeqGkrdS5c-v3VB2b9WrfJcs5-qkTdteJgeP1fNN8zS71Yvl_G52tdAFox90JgLHKbKkhBaNCTZEAAwGI7UWNz5bZsIgzpPzGWNmNmwgUxJp0Y7V9L9bRGS978pH6n7WhyP7CxmxPOw</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Jung-Tang Huang</creator><creator>Yu-Jen Lai</creator><creator>Shao-Chang Cheng</creator><creator>Sheng-Hsiung Shih</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2005</creationdate><title>DEP-base particle counting device</title><author>Jung-Tang Huang ; Yu-Jen Lai ; Shao-Chang Cheng ; Sheng-Hsiung Shih</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-c88049a79eaa13122636700162178f31b5c399816e45845c17c992920c8aeef13</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Conductivity</topic><topic>Counting circuits</topic><topic>Dielectrophoresis</topic><topic>Electric resistance</topic><topic>Electric variables measurement</topic><topic>Frequency</topic><topic>Particle measurements</topic><topic>Permittivity</topic><topic>Polarization</topic><topic>Semiconductor device measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Jung-Tang Huang</creatorcontrib><creatorcontrib>Yu-Jen Lai</creatorcontrib><creatorcontrib>Shao-Chang Cheng</creatorcontrib><creatorcontrib>Sheng-Hsiung Shih</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jung-Tang Huang</au><au>Yu-Jen Lai</au><au>Shao-Chang Cheng</au><au>Sheng-Hsiung Shih</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>DEP-base particle counting device</atitle><btitle>The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05</btitle><stitle>SENSOR</stitle><date>2005</date><risdate>2005</risdate><volume>2</volume><spage>1628</spage><epage>1631 Vol. 2</epage><pages>1628-1631 Vol. 2</pages><issn>2159-547X</issn><isbn>0780389948</isbn><isbn>9780780389946</isbn><abstract>The research disclosed a particle-counting device which can reliably count particles in the fixed quantity of sample solution. Let sample drop in the chip inlet, then use dielectrophoresis (DEP) force produced by separation device on the chip to separate and move specific particles to micro-pore. High reliable Coulter principle had been introduced on this device. When the particles pass through the micro-pore one by one, recording the numbers of ion current reduction events can correctly count the quantity of specific particles in the fixed volume of sample solution.</abstract><pub>IEEE</pub><doi>10.1109/SENSOR.2005.1497400</doi></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 2159-547X |
| ispartof | The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05, 2005, Vol.2, p.1628-1631 Vol. 2 |
| issn | 2159-547X |
| language | eng |
| recordid | cdi_ieee_primary_1497400 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Conductivity Counting circuits Dielectrophoresis Electric resistance Electric variables measurement Frequency Particle measurements Permittivity Polarization Semiconductor device measurement |
| title | DEP-base particle counting device |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T13%3A27%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=DEP-base%20particle%20counting%20device&rft.btitle=The%2013th%20International%20Conference%20on%20Solid-State%20Sensors,%20Actuators%20and%20Microsystems,%202005.%20Digest%20of%20Technical%20Papers.%20TRANSDUCERS%20'05&rft.au=Jung-Tang%20Huang&rft.date=2005&rft.volume=2&rft.spage=1628&rft.epage=1631%20Vol.%202&rft.pages=1628-1631%20Vol.%202&rft.issn=2159-547X&rft.isbn=0780389948&rft.isbn_list=9780780389946&rft_id=info:doi/10.1109/SENSOR.2005.1497400&rft_dat=%3Cieee_6IE%3E1497400%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1497400&rfr_iscdi=true |