Characteristics of charge accumulation in glass materials under electron beam irradiation
Space charge formation in various glass materials under electron beam irradiation was investigated. Charging of spacecraft occurs in plasma and radiation environment. Especially, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of solar panel...
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creator | Miyake, H. Tanaka, Y. Takada, T. Liu, R. |
description | Space charge formation in various glass materials under electron beam irradiation was investigated. Charging of spacecraft occurs in plasma and radiation environment. Especially, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation by using a PEA (pulsed electro-acoustic method) system. In the case of a quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, positive charge accumulation was observed in glass samples containing metal-oxide components. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal-oxide components and calculated the trap energy depths from the charge decay characteristics of all glass samples. Furthermore, the dependence of the polarity of accumulated charges on the component of glass materials is discussed by using the models of energy bands. |
doi_str_mv | 10.1109/ISEIM.2005.193321 |
format | Conference Proceeding |
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Charging of spacecraft occurs in plasma and radiation environment. Especially, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation by using a PEA (pulsed electro-acoustic method) system. In the case of a quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, positive charge accumulation was observed in glass samples containing metal-oxide components. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal-oxide components and calculated the trap energy depths from the charge decay characteristics of all glass samples. Furthermore, the dependence of the polarity of accumulated charges on the component of glass materials is discussed by using the models of energy bands.</description><identifier>ISBN: 9784886860637</identifier><identifier>ISBN: 488686063X</identifier><identifier>DOI: 10.1109/ISEIM.2005.193321</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aircraft manufacture ; Charge measurement ; Current measurement ; Electron beams ; Glass ; Impurities ; Plasma materials processing ; Plasma measurements ; Plasma properties ; Space charge</subject><ispartof>Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. 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(ISEIM 2005)</title><addtitle>ISEIM</addtitle><description>Space charge formation in various glass materials under electron beam irradiation was investigated. Charging of spacecraft occurs in plasma and radiation environment. Especially, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation by using a PEA (pulsed electro-acoustic method) system. In the case of a quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, positive charge accumulation was observed in glass samples containing metal-oxide components. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal-oxide components and calculated the trap energy depths from the charge decay characteristics of all glass samples. Furthermore, the dependence of the polarity of accumulated charges on the component of glass materials is discussed by using the models of energy bands.</description><subject>Aircraft manufacture</subject><subject>Charge measurement</subject><subject>Current measurement</subject><subject>Electron beams</subject><subject>Glass</subject><subject>Impurities</subject><subject>Plasma materials processing</subject><subject>Plasma measurements</subject><subject>Plasma properties</subject><subject>Space charge</subject><isbn>9784886860637</isbn><isbn>488686063X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjsFOwzAQRC0hJFDpByAu_oGGXTuO7SOqCkQq4gAcOFUbZ1OMkhTZ6YG_J0BPI43eG40Q1wgFIvjb-mVTPxUKwBTotVZ4JpbeutK5ylVQaXshljl_AgD60qCBS_G-_qBEYeIU8xRDlodOhrnas6QQjsOxpykeRhlHue8pZznQL0t9lsex5SS55zClmWiYBhlTojb-KVfivJsxXp5yId7uN6_rx9X2-aFe321XUaGfVpYNO2UrrVrtGtXo1lpq54fEpmwdWgUNWegAOHjSDVaMBAYC-4C66_RC3PzvRmbefaU4UPreYekrKJX-AfdTUnI</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Miyake, H.</creator><creator>Tanaka, Y.</creator><creator>Takada, T.</creator><creator>Liu, R.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2005</creationdate><title>Characteristics of charge accumulation in glass materials under electron beam irradiation</title><author>Miyake, H. ; Tanaka, Y. ; Takada, T. ; Liu, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i219t-7e5e827632d38b2b3d77ad001ae54d81720ba70f00ec9a3b16e1a050ce9c13ff3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Aircraft manufacture</topic><topic>Charge measurement</topic><topic>Current measurement</topic><topic>Electron beams</topic><topic>Glass</topic><topic>Impurities</topic><topic>Plasma materials processing</topic><topic>Plasma measurements</topic><topic>Plasma properties</topic><topic>Space charge</topic><toplevel>online_resources</toplevel><creatorcontrib>Miyake, H.</creatorcontrib><creatorcontrib>Tanaka, Y.</creatorcontrib><creatorcontrib>Takada, T.</creatorcontrib><creatorcontrib>Liu, R.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Miyake, H.</au><au>Tanaka, Y.</au><au>Takada, T.</au><au>Liu, R.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Characteristics of charge accumulation in glass materials under electron beam irradiation</atitle><btitle>Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005)</btitle><stitle>ISEIM</stitle><date>2005</date><risdate>2005</risdate><volume>1</volume><spage>49</spage><epage>52 Vol. 1</epage><pages>49-52 Vol. 1</pages><isbn>9784886860637</isbn><isbn>488686063X</isbn><abstract>Space charge formation in various glass materials under electron beam irradiation was investigated. Charging of spacecraft occurs in plasma and radiation environment. Especially, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation by using a PEA (pulsed electro-acoustic method) system. In the case of a quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, positive charge accumulation was observed in glass samples containing metal-oxide components. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal-oxide components and calculated the trap energy depths from the charge decay characteristics of all glass samples. Furthermore, the dependence of the polarity of accumulated charges on the component of glass materials is discussed by using the models of energy bands.</abstract><pub>IEEE</pub><doi>10.1109/ISEIM.2005.193321</doi></addata></record> |
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subjects | Aircraft manufacture Charge measurement Current measurement Electron beams Glass Impurities Plasma materials processing Plasma measurements Plasma properties Space charge |
title | Characteristics of charge accumulation in glass materials under electron beam irradiation |
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